Covalent Metrology Acquires Riga Analytical Lab

Installation of a new Talos S/TEM from Thermo Scientific at Covalent’s Sunnyvale, CA, headquarters will accelerate analysis and enhance the ease and quality of S/TEM services.​

Covalent Metrology Acquires Riga Analytical Lab

Long-time industry expert’s team and resources to join Covalent’s rapidly growing operation, offering one of the broadest service portfolios in North America to more than 500 customers combined

“Today, I am thrilled to announce the acquisition of Riga Analytical Lab.

I am humbled that Riga Analytical Lab CEO, Giorgio Riga, has selected Covalent as the heir and beneficiary of the business he has built over these many years. The acquisition advances Covalent’s mission to provide the marketplace with affordable access to cutting-edge data at ever faster turnaround times. We welcome Giorgio and his entire technical team to the Covalent family. Please take a moment to read the full press release announcement.”

Craig Hunter
CEO, Covalent Metrology

September 01, 2020Sunnyvale, CA. Covalent Metrology, a leading provider of metrology and analytical services to advanced materials innovation companies, announced the acquisition of Riga Analytical Lab, an independent laboratory located in the heart of Silicon Valley. The acquisition is effective immediately.

Giorgio Riga, CEO of Riga Analytical Lab, is a widely recognized leader in the field of semiconductor Failure Analysis, having founded and continuously run the business since 1982. Mr. Riga has been a Member of Covalent’s Advisory Board since its inception, and now joins Covalent in the capacity of Senior Advisor to the CEO.

The entire Riga Analytical Lab technical team has joined Covalent and now serves as the core of an expanded Failure Analysis group. Terms of the deal were not disclosed.

Covalent’s portfolio offers +100 techniques and services. With the addition of Riga Analytical Lab’s full menu of semiconductor and device analysis services that include failure root cause analysis, Auger Electron Spectroscopy, IR imaging, de-packaging and de-layering and more, Covalent adds significant depth in serving high growth market segments that include semiconductor, advanced packaging, fiber optic components, MEMS, hybrid modules, flat panel displays, magnetic media and printed circuit boards.

“Giorgio has been a highly respected figure in Silicon Valley for decades,” stated Craig Hunter, CEO of Covalent Metrology. “I am humbled that he selected Covalent as the heir and beneficiary of the business he has built over these many years. Having him and his highly trained and experienced team join Covalent brings us into the world of chip failure analysis and electrical failure analysis – two strategic segments that we previously had not been serving. We believe the combined services, expertise and client relationships of the two organizations positions Covalent very strongly for further expansion and future growth.”

Giorgio Riga added, “For the past 38 years now, my team and I have been dedicated to solving our clients’ most pressing problems. I am positive that Riga Analytical clients will be well-served by this deal and will find outstanding service and an expanded product offering now that we are part of Covalent. And for my team, joining Covalent is a great opportunity to become part of a high growth, disruptive new player already making a big impact on the world of metrology and characterization. I have seen Covalent from its inception just a few years ago, and it is amazing how quickly this company has grown. Craig and his team are thinking big, and we are very happy to be a part of it.”

The acquisition advances Covalent’s mission to provide the marketplace with affordable access to cutting-edge data at ever faster turnaround times.

Covalent Metrology Logo

About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.

Covalent now has over 500 customers in 20+ industries.

Learn more at: https://covalentmetrology.com/

Covalent Announces Major Advancement in (Scanning) Transmission Electron Microscopy (S/TEM) Analytical Services

Installation of a new Talos S/TEM from Thermo Scientific at Covalent’s Sunnyvale, CA, headquarters will accelerate analysis and enhance the ease and quality of S/TEM services.​

Covalent Metrology Introduces Major Advancement in (Scanning) Transmission Electron Microscopy (S/TEM) Analytical Services

Installation of a new Talos S/TEM from Thermo Scientific at Covalent’s Sunnyvale, CA, headquarters will accelerate analysis and enhance the ease and quality of S/TEM services.

Talos PR-Covalent

August 12, 2020Sunnyvale, CA. Covalent Metrology has completed installation of a new Thermo Scientific Talos F200X G2 S/TEM at its Sunnyvale, CA headquarters. This system, available now, generates clearer images with greater and improved elemental and structural information compared to earlier generation S/TEMs. The Talos S/TEM will round out a complete suite of in-house instrumentation for electron microscopy analysis, enabling Covalent to deliver industry leading S/TEM analysis with rapid turnaround times and no expedite fees.

Covalent Metrology is now positioned to help scientists and engineers tap into S/TEM characterization solutions by providing affordable atomic-level resolution images, diffraction patterns for crystallography, and elemental composition through energy dispersive x-ray spectroscopy (EDS). Previously, accessing these types of high-quality S/TEM measurements could often be expensive, unpredictable, and challenging for many companies and researchers without robust internal S/TEM resources. At the same time, results of S/TEM analysis can prove crucial for R&D work spanning a vast array of industries: from microelectronics and semiconductors to nanomaterials, thin films, molecular biology, and more.

The Talos F200X G2 S/TEM includes a Gatan OneView CCD camera, conferring 16x greater resolution and pixel density over past generations of camera systems for maximized information capture in every frame. Additionally, its quad-EDS detectors allow for rapid, high-sensitivity elemental analysis with reduced risk of sample damage. These upgrades, along with in-house sample preparation using Covalent’s two high-precision dual-beam FIB-SEM systems, make exceptional S/TEM data accessible to clients easily and efficiently.

To head Covalent’s new S/TEM service branch, the company has appointed two leading S/TEM experts: Jason Donald, as Director, S/TEM and Lamella Prep, and Roozbeh Nikkhah Moshaie, PhD, as Senior Member of Technical Staff for S/TEM characterization. Jason brings over 24 years of operational experience with FEI / Thermo Fisher electron microscopes, and Dr. Nikkhah Moshaie is a materials engineer with over 10 years of experience in TEM characterization of metallurgical and nanomaterial samples.

“We are ecstatic to utilize the Talos and our new, recently-announced, in-house Helios 5 and Scios focused ion beam scanning electron microscopes (FIB-SEMs) to deliver world-class S/TEM characterization!” stated Jeff Sullivan, VP, Metrology Partners. “These systems generate exceptional images in addition to analytical results relevant to addressing customers’ specific needs. With our burgeoning S/TEM team and the Talos, Covalent will broaden and deepen our support of client innovations in advanced materials.”

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.

Covalent has nearly 300 customers in 20+ industries.

Learn more at: https://covalentmetrology.com/

Covalent Metrology Announces New FIB-SEM Services with Significant Advances in Imaging Resolution

Covalent Metrology Announces New FIB-SEM Services with Significant Advances in Imaging Resolution

The Company’s extensive roster of industry-leading instrumentation expands to include two powerful FIB-SEM systems from Thermo Scientific: the Helios 5 and Scios.

July 8, 2020 – Sunnyvale, CAThe introduction of two cutting-edge dual-beam focused ion beam scanning electron (FIB-SEM) microscopes at Covalent’s Sunnyvale, CA headquarters will provide clients faster, deeper, and more advanced analytical capabilities.

The Helios 5 provides superlative resolution for enhanced measurement and visualization – with specialized features particularly beneficial to clients characterizing devices or complex nanostructures. The Scios has comparable ultra-high resolution with immense adaptability to accommodate challenging materials: including samples previously untenable on an electron microscope. Its potent charge neutralization system enables full dual-beam manipulation and imaging of magnetic samples, and enables imaging at pressures well above vacuum. These capabilities pave the way for unprecedented applications opportunities for geological, biotech, and biomedical research, as well as metallurgical testing in the auto, aerospace, construction, and manufacturing industries.

Dr. Jeff Sullivan, V.P. of Metrology Partners, comments: “we are thrilled to be able to serve our clients’ most challenging electron microscopy needs with these two complementary systems.” Customizations on each tool have been adapted to confer significantly clearer images and more accurate measurements on a broader range of sample types. Dr. Sullivan continues: “with these instruments in house, we can deliver more advanced FIB-SEM analysis and tackle previously impossible measurements, now faster than ever before.”

In addition to the advancements in imaging functionality on each instrument, both are equipped with new scanning transmission electron microscopy (STEM) detectors and state-of-art energy dispersive spectrometers for more accurate element detection. Augmented with a suite of advanced automation tools for tomography and TEM sample preparation, they can each support more affordable, expedited electron microscopy analysis with substantially improved performance.

Craig Hunter, Founder and Chief Executive Officer, states: “with the installation of the Helios 5 and Scios, Covalent takes the next step forward in its mission to provide clients with cutting-edge data at ever faster turnaround times.” Covalent’s technique and services portfolio is one of the most expansive in North America. With the addition of the new electron microscopy techniques announced today, the company is now offering over 100 analytical techniques and services.

Covalent Metrology Logo

About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.

Covalent has nearly 300 customers in 20+ industries.

Learn more at: https://covalentmetrology.com/

Dr. Chris Moore delivers X-ray Diffraction Technical Webinar at NCCAVS TFUG Online Seminar

Covalent X-ray Metrology Expert Dr. Chris Moore presents technical talk at NCCAVS TFUG seminar.

DR. CHRIS MOORE DELIVERS X-RAY DIFFRACTION TECHNICAL WEBINAR AT NCCAVS TFUG ONLINE SEMINAR

Covalent X-ray Metrology Expert Dr. Chris Moore presents technical talk at NCCAVS TFUG seminar.

Covalent’s Vice President of Technology, Dr. Chris Moore, lent his expertise in X-ray metrology to the Thin Film User Group of the Northern California chapter of AVS (NCCAVS) for their online technical seminar in May, 2020. The meeting explored state-of-art thin-films metrology and characterization applications for semiconductors and related fields.

Dr. Moore’s informative talk highlighted the theoretical basis of X-ray diffraction (XRD) measurements, and noted crucial practical considerations for XRD: use of standards, choosing appropriate beam geometries, and pattern fitting of data. He then presented a selection of case studies demonstrating the versatile utility of XRD for thin-films research.

A copy of Dr. Moore’s presentation, titled X-Ray Diffraction: From Easy to Hard, is free to download through our Covalent Community. Additionally, slides for the the talk may be accessed online through the NCCAVS TFUG Proceedings record.

Chris has over 30 years of experience in metrology techniques and the development of metrology systems. Originally the VP of Technology for Waterloo Scientific, Chris moved into a technical marketing role and became part of Philips Analytical when WSI was purchased by Phillips. Eventually he became President ad CEO of Phillips Advanced Metrology Systems, Advanced Metrology Systems and finally Semilab USA. After a stint of high technology consulting Chris moved west to join Frontier Semiconductor as VP of Marketing and Sales before joining Covalent as the Vice President of Technology and Operations.

With his generalist metrology background and expertise and significant management and leadership experience, Chris adds significant depth to the Covalent team.

Chris has a PhD in solid state physics from the University of Waterloo.

New Anton Paar Demo Lab Commissioned at Covalent – Learn More this Week on Covalent Academy!

Rheological and Particle Characterization Lab Opens at Covalent Metrology; Dr. Sophia Yan to head this lab and lead Covalent Academy this week

May 8, 2020 — Sunnyvale, CA. — Covalent Metrology is excited to formally announce the hiring of Dr. Sophia Yan to run our newly commissioned Rheological and Particle Characterization lab. As was announced in Dec, 2020, the facility will dually serve another purpose as the Silicon Valley demo lab for our strategic instrument partner, Anton Paar. Covalent Metrology is thrilled to be showcasing their suite of instrumentation for advanced rheological and particle analyses.

We are pleased to announce that this lab is now up and running! Dr. Yan and her team can now provide measurement and characterization of a number of critical materials properties:

  • Bulk Rheological Parameters – The best-in-class MCR 302 measures both time and temperature dependence of bulk rheological parameters such as viscosity and shear modulus. Rheological properties such as shear thinning, gelation and aging are critical insights to the performance and stability of many consumer and commercial products.
  • Dynamic Light Scattering (DLS) & Zeta Potential for Colloids – The Litesizer™ 500 measures zeta potential of colloidal dispersion in high concentrations up to 70% w/v in aqueous and non-aqueous media. DLS is typically utilized in characterizing the Brownian motion of particles and colloids. It provides useful information for formulation development such as stability and size distribution of dispersed particles and emulsions.
  • Dry Powder and Liquid Particle Size Analysis – The versatile PSA 1190LD can disperse, deagglomerate, and analyze the full measurement range of particle size from 40nm to 2.5mm. This laser diffraction instrument covers many applications of ingredient powders, pastes, slurries and dispersions used in pharmaceuticals, cosmetics, food, semiconductor, and biotech.
  • Zeta Potential for Solid Surfaces – The state-of-the-art SurPASS™ 3 mesaures zeta potential for active surfaces such as semiconductor wafer and pads, surface adsorption kinetics such as water filtration systems, and pH-dependent isoelectric points. Additionally, thermal management up to 40 deg C will enable temperature-controlled studies which are often required for bio-pharma industries.
Episode 7 Particle Analysis

This week on Covalent Academy, Dr. Yan will kick off the new lab launch a webinar on the field of particle characterization: what is entails, why it matters, and how it’s done. Her talk will also highlight key considerations for the industrial applications of these techniques, and comment on some practical aspects of instrumentation.

The event, Particle Analysis for Industrial Product Success, will be aired live at 11am PDT on May 14th. Click below to register for this upcoming webinar!

J.A. Woollam and Covalent Metrology Announce Ellipsometry Partnership

Collaboration Focused on Developing New Applications and Promoting Adoption of Advanced Spectroscopic Ellipsometry

May 5, 2020 — Lincoln, NE and Sunnyvale, CA. — J.A. Woollam and Covalent Metrology Services have announced a partnership to promote and further advance spectroscopic ellipsometry technology, a powerful analytical technique used to optically characterize advanced materials and thin films. The two companies will work together on education, training and marketing as well as development of new applications where the sensitivity and convenience of ellipsometry can provide key results for engineering problems.

Covalent offers a broad range of metrology and characterization services, both from its Silicon Valley laboratory and a proprietary network of partner labs. Covalent recently acquired a fully equipped RC2 spectroscopic ellipsometer designed and manufactured by J.A. Woollam. The system has been engineered to have the versatility required for many diverse applications. It features:

  • a wide spectral range from 193 nm to 1690 nm, with over 1,000 individual wavelengths,
  • a fully automated 300 mm mapping sample stage for uniformity studies,
  • a variable angle transmission stage,
  • beam focusing down to 300 µm, and
  • full Mueller matrix measurement capability for maximum sensitivity to challenging anisotropic samples.

J.A. Woollam has been the leading manufacturer of spectroscopic ellipsometers for more than 30 years. The company is based in Lincoln, NE, and will be using Covalent’s Silicon Valley facility for training and demonstrations on the West Coast. The two parties will leverage their respective strengths collaboratively to provide convenient access to world class instrumentation and expert optical modeling in the heart of a leading US technological hub.

James Hilfiker, Director at J.A. Woollam says, “The field of spectroscopic ellipsometry has continued to grow for decades and we are extremely excited to partner with Covalent Metrology to offer service measurements on some of the best equipment in the world by some of the top researchers in their area. Covalent has demonstrated their expertise lies beyond simply providing data to customers, as their team of in-house experts help users understand what each type of measurement can truly provide for their applications.”

Craig Hunter, CEO of Covalent stated, “The Woollam brand and technology is essentially synonymous with spectroscopic ellipsometry. The company has been at the forefront of this field for decades. We are extremely excited to partner with J.A. Woollam and honored that they view the collaboration with Covalent as a strategic move for them to expand their footprint.”

JA-Woollam Logo

About J.A. Woollam
Founded by Professor John A. Woollam based on a spin-off from the University of Nebraska, the company has rapidly grown to become a worldwide leader in spectroscopic ellipsometry. J.A. Woollam has been perfecting its technology for over 30 years and has secured over 200 patents, all pertaining to spectroscopic ellipsometry.

More information on the J.A. Woollam Company products can be found at jawoollam.com.

Covalent Metrology Logo

About Covalent
Covalent Metrology is a disruptive analytical services lab and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insight about key research, development and production programs faster, more easily and less expensively. Covalent is dramatically changing the characterization and imaging landscape by combining innovative pricing, data platforms and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships. Covalent has nearly 300 customers in 20+ industries.

More information on Covalent Metrology can be found at covalentmetrology.com

To read the original press release via PR Newswire, click here.

Rigaku to Present at Covalent’s Inaugural ‘Advancements in Instrumentation’ Webinar

Rigaku and Covalent Academy will present a webinar exploring X-Ray Computed Tomography tools and techniques for materials characterization

May 1, 2020 – Sunnyvale, CA. Rigaku Corporation, a global leader in X-ray analytical instrumentation, is pleased to announce the debut of the inaugural episode the new Advancements in Instrumentation webinar series, presented by Covalent Metrology.

The event is part of the ongoing partnership between Rigaku and Covalent, established to support high-tech industries with the latest innovations in the field of analytical technology.  The webinar, X-ray Computed Tomography: The Superpower System, will air on Thursday, May 7th, at 11am PDT.

Rigaku develops powerful tools and technologies for X-ray characterization. Rigaku Director of X-ray Imaging, Aya Takase, who specializes in developing new analytical and measurement methods for X-ray tools will introduce the key ideas behind one of the most compelling new technologies in X-ray metrology: computed tomography (CT).

CT makes use of computer-processed combinations of numerous X-ray measurements taken from different angles to produce cross-sectional images of specific areas of a scanned object. X-ray computed tomography (X-ray CT or Micro-CT) is a powerful imaging technique that generates high-resolution, total 3D visualizations of a scanned volume of material. This process, called tomography, can be employed for flaw detection, failure analysis, measurement of critical dimensions and characterization of features such as pores or internal circuitry.

The episode will provide an introduction to CT, descriptions of field-of-view and resolution with the technique, and an exploration of recent advances in the technology.  It will address some common challenges and practical considerations for X-ray-CT operation, discuss instrumentation options and review case studies and advances in technique development.

Rigaku CT-Lab-HX130 Instrument
The Rigaku CT Lab HX benchtop X-ray micro CT system

The event will include an in-depth look at the Rigaku CT Lab HX high-performance benchtop X-ray micro CT system. With the most powerful X-ray source in its class (130 kV, 39W), this compact micro CT imaging system can provide three dimensional X-ray image of a wide variety of samples including printed circuit boards (PCBs), batteries, medical device, ceramics, and light metals. Preset scans, programed for typical conditions, require only a few steps to run.

The Rigaku Semiconductor Metrology Division designs and manufactures X-ray based measurement tools to solve semiconductor manufacturing challenges.  More information about semiconductor tools from Rigaku is available at rigaku.com/products/semi.

Covalent Metrology is equipped with a comprehensive lab for high-resolution 3D topology using state-of-the-art, non-contact optical profilometry instruments.  If you are interested in learning more about any techniques or services provided by Covalent, feel free to reach out to us any time at hello@covalentmetrology.com.

The webinar assumes no prior knowledge of CT. The intent is to provide a general overview CT application, strengths and limitations.

Rigaku Logo

About Rigaku
Since its inception in Japan in 1951, Rigaku has been at the forefront of analytical and industrial instrumentation technology.  Rigaku and its subsidiaries form a global group focused on general-purpose analytical instrumentation and the life sciences.  With hundreds of major innovations to their credit, Rigaku companies are world leaders in X-ray spectrometry, diffraction, and optics, as well as small molecule and protein crystallography and semiconductor metrology.  Today, Rigaku employs over 1,400 people in the manufacturing and support of its analytical equipment, which is used in more than 70 countries around the world supporting research, development, and quality assurance activities.  Throughout the world, Rigaku continuously promotes partnerships, dialog, and innovation within the global scientific and industrial communities.

For further information, contact:

Michael Nelson
Rigaku Global Marketing Group
tel: +1 512-225-1796

michael.nelson@rigaku.com

Covalent Metrology Logo

About Covalent
Covalent Metrology is a disruptive analytical services lab and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insight about key research, development and production programs faster, more easily and less expensively. Covalent is dramatically changing the characterization and imaging landscape by combining innovative pricing, data platforms and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships. Covalent has nearly 300 customers in 20+ industries.

For further information, contact:

Doris Chun
Covalent Metrology Marketing
tel: +1 408-498-4611

doris@covalentmetrology.com

Covalent Academy Ep.05 Upcoming


Ep05-CovalentAcademyBanner

April 24, 2020

Covalent Academy Episode 05, SEM/FIB Dual Beam Microscopy; A Powerful Combination, will air on Thursday of next week, April 30th, at 11am PDT.

For this episode, Covalent SEM expert, Dave Soltz, will take you through the fundamentals of scanning electron microscopy (SEM) and focused-ion-beam microscopy (FIB), including an introduction to these tools’ operating principles and electron optics. He will also be covering applications and techniques incorporating these tools, and provide guidance for how to best utilize them for characterization solutions.

Click Here to Register Now!

This week, we wrapped up our Surface Roughness miniseries with a talk on Stylus Profilometry and AFM, given by Austin Barnes.

If you were unable to attend, a recording of the event, as well as Q&A responses, will be made available shortly through the Covalent Community module of the Covalent Member Portal.

Feel free to contact us with any questions: hello@covalentmetrology.com.

 

Covalent Academy Ep.04 Upcoming

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April 17, 2020

This week Covalent Academy launched the 2nd installment of our miniseries on surface roughness characterization: Optical Profilometry – Surface Roughness Characterization for Smooth Operators.

Optical Profilometry expert, Matt Wong, provided a deeper look into optical tools used to characterize surface roughness, and supplied practical guidance for optimizing analysis on these instruments.

We are excited to report that this event continued the strong trend of live attendance for our Covalent Academy broadcasts, and we would like to thank all our viewers for spending their time with us to deepen familiarity with these metrology systems.

If you were unable to attend, a recording of the event, as well as Q&A responses, will be made available shortly through the Covalent Community module of the Covalent Member Portal.

Next week, we will be launching the finale of our surface characterization series: Stylus Profilometry / AFM – Techniques for High Resolution Surface Metrology & Imaging: A User’s Guide on Thursday, April 23rd at 11AM PDT.

Click Here to Register Now!

During the event, Dr. Austin Barnes will break down the diversity of scanning-probe instrumentation available for surface characterization, and will explain how these tools can be differentiated from optical techniques and optimized for your surface characterization needs.

Covalent Academy Ep.03

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April 10, 2020

This week on Covalent Academy, we will be continuing our Surface Roughness webinar miniseries.

Part 2/3 in the series, Optical Profilometry: Surface Roughness Characterization for Smooth Operators, will be offered Wednesday of next week, April 15th, 11am PDT.

Our resident expert on optical profilometry and spectroscopy, Matthew Wong, will be guiding you through the optical techniques we use to analyze the topography of surfaces. This includes: laser scanning confocal microscopy, white light interferometry, wide-area patterned light, and chromatic aberration. He will cover their strengths and limitations, and explore which technique is best-suited to different applications.

Register now for this event!

If you have any questions, please feel free to contact us at: hello@covalentmetrology.com.