Choosing the Right Surface Imaging Technique

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2597Choosing the Right Surface Imaging Technique

With so many surface imaging techniques available, it can be a challenge to select the best method for your project. Each technique provides surface data which can impact numerous functional characteristics of materials, parts, and devices. This eBrief will provide a quick reference of key considerations across 8 main surface imaging methods to help you make the best choice, faster.

For more information about the techniques in this eBrief, check out:

Atomic Force Microscopy (AFM)

Chromatic Dispersion Profilometry (CDP)

Laser Scanning Confocal Microscopy (LSCM)

Scanning Electron Microscopy (SEM)

Transmission Electron Microscopy (TEM)

White Light Interferometry (WLI)

Wide-Area 3D Patterned Light Measurement (VR)

Read the blog: Guiding Principles when Planning Surface Roughness Analysis

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Covalent Metrology’s suite of surface imaging instruments support critical dimension analysis on samples from sub-micron-scale devices through to centimeter-scale mechanical parts. Some of these systems also incorporate supplementary measurement accessories that facilitate integrated element analysis (via Energy Dispersive Spectroscopy on all available electron microscopes) and nanomechanical testing (via specialized probes available on the Anton Paar Tosca AFM).

Using these cutting-edge instruments, Covalent’s team of experts deliver affordable, impactful imaging and profilometry analysis with fast turnaround times.