April 24, 2020
Covalent Academy Episode 05, SEM/FIB Dual Beam Microscopy; A Powerful Combination, will air on Thursday of next week, April 30th, at 11am PDT.
For this episode, Covalent SEM expert, Dave Soltz, will take you through the fundamentals of scanning electron microscopy (SEM) and focused-ion-beam microscopy (FIB), including an introduction to these tools’ operating principles and electron optics. He will also be covering applications and techniques incorporating these tools, and provide guidance for how to best utilize them for characterization solutions.
This week, we wrapped up our Surface Roughness miniseries with a talk on Stylus Profilometry and AFM, given by Austin Barnes.
If you were unable to attend, a recording of the event, as well as Q&A responses, will be made available shortly through the Covalent Community module of the Covalent Member Portal.
Feel free to contact us with any questions: email@example.com.