April 17, 2020
This week Covalent Academy launched the 2nd installment of our miniseries on surface roughness characterization: Optical Profilometry – Surface Roughness Characterization for Smooth Operators.
Optical Profilometry expert, Matt Wong, provided a deeper look into optical tools used to characterize surface roughness, and supplied practical guidance for optimizing analysis on these instruments.
We are excited to report that this event continued the strong trend of live attendance for our Covalent Academy broadcasts, and we would like to thank all our viewers for spending their time with us to deepen familiarity with these metrology systems.
If you were unable to attend, a recording of the event, as well as Q&A responses, will be made available shortly through the Covalent Community module of the Covalent Member Portal.
Next week, we will be launching the finale of our surface characterization series: Stylus Profilometry / AFM – Techniques for High Resolution Surface Metrology & Imaging: A User’s Guide on Thursday, April 23rd at 11AM PDT.
During the event, Dr. Austin Barnes will break down the diversity of scanning-probe instrumentation available for surface characterization, and will explain how these tools can be differentiated from optical techniques and optimized for your surface characterization needs.