Scanning Transmission Electron Microscopy: Affordable Imaging and Analysis at Atomic Scale
Take an expert deep-dive into one of the most exciting characterization techniques available: (Scanning) Transmission Electron Microscopy (S/TEM) – the highest-resolution imaging technique in the world today.
S/TEM is able to capture spatial features on the scale of individual atoms, and to map the elemental composition and morphology of complex nanomaterials and devices. These kinds of data can be crucial to diverse industries manipulating ever more intricate nanostructures.
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This Webinar will Cover:
- Fundamentals of TEM and STEM
- Key features and functions of the Talos F200X G2 system (and what they mean for you)
- Proven sample prep methodologies that result in superior data outcomes
- How to wire your brain to interpret grayscale output images
Transmission Electron Microscopy is on the Rise
The latest market research indicates that S/TEM analytical instrumentation and services is a market poised to grow by USD $357.09 million between 2020-2024, largely due to the increasing accessibility and utility of advanced S/TEM microscopes. [1]
The Thermo Scientific Talos F200X G2 system is one such cutting-edge instrument: a 200 kV field emission S/TEM uniquely designed to optimize performance and productivity across a wide range of materials science samples and applications.