Shining a Light on Optical Modeling for Spectral Ellipsometry

Live event scheduled for August 6th, 2020 at 11:00 AM PDT

Covalent Metrology invites you to attend the 14th episode of our Covalent Academy webinar series, presented by Covalent’s own Dr. Max Junda (Senior Member of Technical Staff, Optical Characterization Lab).

The event, Shining a Light on Optical Modeling for Spectral Ellipsometry, will be aired live on August 6, 2020 at 11am PDT.

Spectroscopic Ellipsometry is a powerful and highly sensitive metrology technique. However, unlocking its full potential requires more than collecting sound data. Nearly all results are only obtained after fitting optical models to the measurements; a sometimes-challenging process with significant repercussions for analytical accuracy.

In this episode, we will discuss the many considerations and strategies that go into developing appropriate optical models for a variety of spectral ellipsometry applications.

THIS WEBINAR WILL

  • Introduce optical modeling fundamentals for spectroscopic ellipsometry data: using layered structures and optical properties
  • Describe common challenges and how to minimize and/or overcome them
  • Provide tips for designing experiments to improve model accuracy
  • Showcase various applications featuring a range of sample types and modeling strategies

Dr. Max Junda, as well as a panel of our experts on this subject, will be available to answer questions during a Q&A session at the end of the hour. A recording of the episode, as well as slides and Q&A, will be made available for download after the event through the Covalent Community.

About the Speakers

Max Junda

Max Junda currently works with a variety of optical characterization techniques including spectroscopic ellipsometry, laser confocal microscopy, chromatic confocal microscopy, white light interferometry, and patterned light 3D measurement. His primary expertise, however, is with ellipsometry having worked with instruments spanning the THz to vacuum ultraviolet spectral ranges in both in situ and ex situ measurement modes. Previous experience includes extensive vacuum deposition work for fabrication and optimization of thin film photovoltaics.

Max earned a PhD from the University of Toledo and a BS from Middlebury College, both in Physics.