(Thin Film) Reflections on X-Ray Reflectometry

Join Covalent Academy this week to strengthen your knowledge on one of the most useful non-destructive thin film characterization tools available: X-Ray Reflectometry (XRR).

This technique provides highly accurate layer thickness measurement as well as electron density and interfacial roughness information on single and multilayer thin film materials. This information can be equally useful in quality control of manufacturing processes as in the characterization of pioneering research materials.

Covalent’s resident XRR expert, Dr. Colleen Frazer, will introduce the theoretical aspects of XRR then explore the effects of imperfect samples and improper modeling approaches.

The event, (Thin Film) Reflections on X-Ray Reflectometry, will be aired live at 11am PDT on July 9th, 2020.

XRR is acutely sensitive to exact layer thickness, density gradients, and interfaces due to its selective detection of electron density changes perpendicular to a thin film surface. This makes it a powerful tool for characterization of films grown on wafers, both during and after the film formation process. XRR is often used in combination with X-ray Diffraction (XRD) for layer characterization; however, between the two: XRR provides increased flexibility for accurate analysis of both crystalline and amorphous layers.

Approaches for the software-based modeling done to extract the XRR results are as important as the instrument setup during measurement. Effective post-processing can make the difference between accurate insights, or misleading results that can obstruct effective characterization. Dr. Colleen Frazer will be discussing XRR from measurement setup to data processing and modeling: she will give you the thinking tools you need to avoid pitfalls and maximize your project’s success.


  • Why use XRR?
  • What sample alignment procedures yield best results?
  • How can results best be interpreted – without over-interpreting?
  • What practical considerations are most important in the real world?
  • What are some troubleshooting tactics for XRR?

Whether you plan to run your own XRR experiments or whether you simply want to improve your skills at interpreting XRR data and results: this webinar will help you build effective strategies with this technique. We welcome people of all experience levels to attend.

About the Speakers

Colleen Frazer

Dr. Colleen Frazer supervises all XRD and XRR operations and analysis, giving Covalent’s customers access to the whole gamut of data available from this technique on their samples. She has been focusing on XRD operation and advanced interpretation throughout her whole career, spanning academic institutions, National Labs and private companies: ORNL, University of Kentucky, Penn State University, Sandia National Labs, Philips Lumileds and EAG.

Colleen obtained her PhD in Materials Science and Engineering from the University of Kentucky, concentrating on XRD residual stress measurements in highly textured materials.

About Covalent Metrology
Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.

Covalent now has over 500 customers in 20+ industries.

Learn more at: https://covalentmetrology.com