(Thin Film) Reflections on X-Ray Reflectometry
Join Covalent Academy this week to strengthen your knowledge on one of the most useful non-destructive thin film characterization tools available: X-Ray Reflectometry (XRR).
This technique provides highly accurate layer thickness measurement as well as electron density and interfacial roughness information on single and multilayer thin film materials. This information can be equally useful in quality control of manufacturing processes as in the characterization of pioneering research materials.
Covalent’s resident XRR expert, Dr. Colleen Frazer, will introduce the theoretical aspects of XRR then explore the effects of imperfect samples and improper modeling approaches.
The event, (Thin Film) Reflections on X-Ray Reflectometry, will be aired live at 11am PDT on July 9th, 2020.

About the Speakers

Colleen Frazer
Dr. Colleen Frazer supervises all XRD and XRR operations and analysis, giving Covalent’s customers access to the whole gamut of data available from this technique on their samples. She has been focusing on XRD operation and advanced interpretation throughout her whole career, spanning academic institutions, National Labs and private companies: ORNL, University of Kentucky, Penn State University, Sandia National Labs, Philips Lumileds and EAG.
Colleen obtained her PhD in Materials Science and Engineering from the University of Kentucky, concentrating on XRD residual stress measurements in highly textured materials.