Events Archive

September 16th, 2022

2022-09-16

NanoSIMS: High Sensitivity Imaging Analysis for Devices

Nanoscale Secondary Ion Mass Spectroscopy (NanoSIMS) is a unique analytical method which combines the extremely high sensitivity and mass resolution of SIMS with an improved optical design that facilitates high lateral resolution (as low as 50 nm): up to 50 times greater than conventional SIMS. This facilitates targeting of microscopic grains and structures in materials ...

May 19th, 2022

2022-05-19

Characterization of Climate Beneficial Materials by Gas Sorption

Gas sorption analysis helps to drive rapid advancement and commercialization of innovative materials and climate solutions. It is used to track and control the quality of raw materials, and to optimize performance in products related to many climate applications. In this webinar, guest speaker Martin Thomas, PhD, from Anton Paar will be exploring a variety ...

March 24th, 2022

2022-03-24

Advanced Analytical Scanning Transmission Electron Microscopy (STEM), and Future Directions

There has been increasing demand for so-called ‘workhorse’-type transmission electron microscopes as the technologies and techniques in (scanning) transmission electron microscopy (S/TEM) have evolved. Researchers and engineers from diverse industries depend on the unparalleled spatial resolution of S/TEM imaging for key structural insight into novel nanomaterials and devices, spurring recent developments of more flexible, reliable ...

February 10th, 2022

2022-02-10

Laser Ablation Inductively Coupled Plasma Mass Spectroscopy (LA-ICPMS): Not Just Rocks

Recent advances in laser ablation technology have broadened the scope and utility of LA-ICPMS to new fields of both research and industry. Today’s laser ablation systems provide flexible elemental analysis and can perform rapid depth-profiling analysis with nanometer-scale vertical precision. As a result, LA-ICPMS is blossoming into new applications in biomedical research, electronics, and materials ...

January 27th, 2022

2022-01-27

Adventures in Wavelength Dispersive X-ray Fluorescence (WDXRF): Flexible Element Analysis for Thin Films and More

While many materials scientists and engineers have heard about energy-dispersive x-ray spectroscopy techniques, fewer experts know about the unique advantages and applications of their sister technique, wavelength-dispersive x-ray fluorescence spectroscopy (WDXRF). Both methods measure elemental composition by analyzing the intensities of characteristic x-ray photons; however, WDXRF achieves higher peak resolution, fewer spectral interferences, and lower ...

December 2nd, 2021

2021-12-02

Fast Characterization of Nanometer Thin to Thick Coatings using Pulsed-RF Glow Discharge Optical Emission Spectrometry

Glow Discharge Optical Emission Spectrometry (GDOES) is a flexible elemental analysis technique used to efficiently characterize both conductive and non-conductive materials and coatings. It combines high depth-precision and elemental sensitivity with one of the broadest detection ranges among any spectroscopic technique. This versatility, paired with the technique’s hallmark speed-to-data, makes it well suited for a ...

November 11th, 2021

2021-11-11

Modernizing Microscopy Methods: Capabilities and Applications of TEM/STEM Systems

Modern (scanning) transmission electron microscopy (S/TEM) tools, like the Talos F200X system at Covalent, are outfitted with technologies that allow analysts to craft an optimum imaging session for the unique needs of each client project. In this webinar event, guest speaker Dr. Jan Ringnalda from Thermo Fisher Scientific will be exploring both basic and advanced ...

October 21st, 2021

2021-10-21

Upgrading Metrology Services with Mountains™ 9: Improved Automation, Visualization, and Analysis

The best dataset in the world would be useless without the right tools for data processing, statistical analysis, and visualization. Join in the live event to experience a real-time demonstration of Covalent’s powerful new capabilities enabled by Digital Surf’s new Mountains™ 9 software package and get a glimpse of how this suite of tools can ...

October 7th, 2021

2021-10-07

Porometry, Porosimetry, and Pycnometry: the 3 P’s You Need for Porous Materials Characterization

Membranes and porous materials integrated in everything from personal protective equipment (PPE) to industrial concrete are often misunderstood. In many cases, scientists and engineers working with such substrates may not realize how affordably and robustly they can be characterized. In this webinar event, Dr. Nanette Jarenwattananon will break down the fundamentals of 3 of the ...

July 15th, 2021

2021-07-15

Sample Preparation Orientation and its Value for (Scanning) Transmission Electron Microscopy

High-quality sample preparation for (scanning) transmission electron microscopy (S/TEM) can make the difference between impactful or mediocre analysis. An ideal lamella – the prepared cross-section of a sample – captures the right aspects of a feature of interest, balances signal intensity for structure and element analysis, and enhances the clarity of the end-image. Producing such ...

June 17th, 2021

2021-06-17

Nanoindentation with the UNHT3 Indentation Tester: Nanomechanical Analysis with a Big Impact

Nanoindentation probes a host of mechanical properties – including modulus, hardness, stress, strain-rate sensitivity, and more – while achieving improved flexibility and adaptability over conventional mechanical analysis techniques. In spite of its advantages, many engineers may still be unaware of the diverse applications nanoindentation supports. In the upcoming live webinar event, guest speaker Patrick O’Hara ...

May 6th, 2021

2021-05-06

Optimizing Polymers and Adhesive Materials with Thermogravimetric Analysis and Differential Scanning Calorimetry

Whether you’re designing parts for Formula 1 racecars, engineering biomedical implants for hospital patients, or anything in between, robust thermal analysis empowers engineers to fine-tune the thermal properties of advanced materials. The insights gained from thermal analysis can be paramount to designing high-quality parts, products, and devices. In this webinar event, guest speaker Dr. Parth ...

April 22nd, 2021

2021-04-22

Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2

Engineers trying to optimize their processes and materials in the real world often find the undertaking is fraught with difficulties that can lead down time-leeching expensive dead ends in testing and analysis. Everyone understands that time to market is a key driver of success or failure of any project or product and, in many cases, it can make ...

March 25th, 2021

2021-03-25

Energizing Research in Battery Performance with Advanced AFM

Modern day battery technologies are constantly improving. In addition to broader efforts to increase life-span and energy density, batteries are also diversifying to support a broadening array of applications: photovoltaics and green energy installations, consumer electronics, electric vehicles, railway industries, manufacturing sectors, and more. In a recent market analysis report, Grand View Research projected that ...

January 28th, 2021

2021-01-28

3D Tomography Using the DualBeam (SEM-FIB): Imaging, EDS and EBSD

This webinar will introduce 3D tomography using the DualBeam platform, including the plasma and liquid metal ion sources (LMIS). Sample preparation, automated data collection and data reconstruction will be discussed. 3D tomography reconstruction examples will be shown for imaging, EDS and EBSD at both the Gallium Ion Beam and the Xenon plasma FIB scale. The esteemed presenters will focus on: What ...

December 10th, 2020

2020-12-10

Expert Lessons in Electron and Ion Beam Imaging and Interpretation

In this webinar, our experts will discuss cutting-edge techniques and best practices for optimizing images captured with a FIB-SEM DualBeam microscope. Topics will include image interpretation, exploration of new state-of-the-art instrumentation, and the realm of analytical possibilities accessed using these techniques. A DualBeam FIB-SEM combines a scanning electron microscope with a focused-ion-beam (FIB-SEM). With myriad ...

September 28th, 2020

2020-09-28

Work Function: Bridging the Gap Between Theory and Reality

Episode 17 of Covalent Academy will explore common misunderstandings about the work function of materials. We’re dialing in to the mainstream and modern techniques used to measure work function and sharing tactics to ensure you’re accessing the right information with these methods. The work function of a material reflects the amount of energy required to ...

September 3rd, 2020

2020-09-03

Scanning Transmission Electron Microscopy: Affordable Imaging and Analysis at Atomic Scale

In Episode 16 of Covalent Academy, we’re taking an expert deep-dive into one of the most exciting characterization techniques available: (Scanning) Transmission Electron Microscopy (S/TEM) – the highest-resolution imaging technique in the world today. The event, ‘Scanning Transmission Electron Microscopy: Affordable Imaging and Analysis at Atomic Scale’ will be aired live on September 3, 2020 ...

August 20th, 2020

2020-08-20

Seeing in Sound: Ultrasonic Imaging with Scanning Acoustic Microscopy

Tune-in to the next installment of Covalent Academy’s Advancements in Instrumentation webinar miniseries to put a finger to the pulse of innovations in Scanning Acoustic Microscopy (SAM). Guest speaker Lisa Logan from PVA TePla, a global leader in manufacturing acoustic microscopy systems, will describe how acoustic microscopy generates high-resolution 2D and 3D images, and will probe a selection of advanced ...

August 6th, 2020

2020-08-06

Shining a Light on Optical Modeling for Spectral Ellipsometry

Covalent Metrology invites you to attend the 14th episode of our Covalent Academy webinar series, presented by Covalent’s own Dr. Max Junda (Senior Member of Technical Staff, Optical Characterization Lab). The event, Shining a Light on Optical Modeling for Spectral Ellipsometry, will be aired live on August 6, 2020 at 11am PDT. Spectroscopic Ellipsometry is a powerful and highly ...

July 23rd, 2020

2020-07-23

Meet the Onyx EDXRF: High-Speed Analysis of Micron-scale Features and Devices

Next up in our Advancements in Instrumentation webinar miniseries, we’ll explore the breakthrough capabilities in micro-EDXRF analysis made possible by the new Rigaku Onyx micro-spot Energy-dispersive X-ray Fluorescence Spectroscopy (ED-XRF) system: coming soon to Covalent. The event will be aired live at 11am PDT on July 23, 2020. Join in to learn how micro-spot ED-XRF is used to analyze ...

July 9th, 2020

2020-07-09

(Thin Film) Reflections on X-Ray Reflectometry

Join Covalent Academy this week to strengthen your knowledge on one of the most useful non-destructive thin film characterization tools available: X-Ray Reflectometry (XRR). This technique provides highly accurate layer thickness measurement as well as electron density and interfacial roughness information on single and multilayer thin film materials. This information can be equally useful in ...

June 25th, 2020

2020-06-25

Solid Surface Zeta Potential: Industrial Applications, Challenges, and Solutions

We invite you to tune in for Covalent Academy’s next installment of our Advancements in Instrumentation webinar mini-series: keeping you up to date with recent metrology innovations, and showing you how to apply new and improved techniques to yield greater insights into your materials. In this episode Dr. Christine Körner, our esteemed guest expert from Anton Paar, will ...

June 11th, 2020

2020-06-11

XPS – UPS – ISS: Surface Spectroscopic Techniques for Chemical Analysis

Covalent Metrology recently announced the completed installation of its new Thermo Scientific Nexsa XPS system, which incorporates 3 of the most useful surface chemical techniques available: X-ray photoelectron spectroscopy (XPS), ultraviolet photoelectron spectroscopy (UPS), and ion-scattering spectroscopy (ISS). Join Covalent Academy this week to deepen your knowledge on these 3 techniques: what they do best, ...

May 28th, 2020

2020-05-28

Chemical Surface Characterization: What’s on My Surface and Should I Care?

This week, Covalent Academy will launch its next webinar miniseries on Surface Chemical Analysis! For the first episode in the series, we are welcoming back Dr. Chris Moore as our speaker. His talk will branch from our previously covered surface roughness series into chemical analysis, introducing the tools and techniques we use to identify and characterize surface contaminants. ...

May 14th, 2020

2020-05-14

Particle Analysis for Industrial Product Success

This week on Covalent Academy, Dr. Sophia Yan will be guiding an exploration of the field of particle characterization: what is entails, why it matters, and how it’s done. Her talk will also highlight key considerations for the industrial applications of these techniques, and comment on some practical aspects of instrumentation. The event, Particle Analysis for Industrial Product ...

May 7th, 2020

2020-05-07

X-ray Computed Tomography: The Superpower System

Coming soon in May, Covalent Academy will launch the first of our new Advancements in Instrumentation webinar series. We are thrilled to be collaborating with our strategic instrument partners to bring you talks highlighting the latest innovations in the analytical field. Our inaugural episode will be hosted in partnership with Rigaku Americas Corp. Rigaku develops ...