Optical Profilometry

Optical Profilometry Measurement and Imaging Services

Laser Confocal, Patterned Light, White Light Interferometry

In the area of optical profilometry, Covalent Metrology offers Laser Confocal Microscopy, Patterned Light/Wide Area 3D Measurements, and White Light Interferometry. These techniques are valuable for assessing surface topography and other characteristics of a variety of advanced materials and nanotech devices.

Below, you’ll find more information regarding our optical profiling services.

TechniqueLaser Confocal MicroscopyPatterned Light/ wide area 3d measurementWhite Light Interferometry
Tool NameKeyence: VK-X1100Keyence: VR-3200Zygo: ZeGage Plus
Tool Imageproduct-imgproduct-imgproduct-img
Resolutionz: 3 nm
x, y: 120 nm
z: 1-5 µm
x, y: 1-5 µm
z: 1 nm
x, y: 250 nm
Best usesHigh vertical accuracy; High lateral resolutionMeasuring large areas quickly (distances , flatness, step height): cm scaleBest vertical resolution for surface quality of polished surfaces
Materials that can be measuredOpaque, translucent, transparent
Matte to highly reflective
Opaque, translucent
Matte to moderately-reflective
But transparent & highly-reflective requires matte coating
Opaque, translucent, transparent
Matte to highly reflective
Measurement Areaµm to mmmm to cmµm to mm
Maximum stitch area~50x50mm~20cm~1x1cm
LimitationsSteep walls and featuresSteep walls and features
Highly reflective surfaces
  • Steep walls and features
  • Multimaterial Samples
Industries and PartsAutomotive
Biotech and nano-devices
Optical devices
Metal
Materials processing
Semiconductor/Electronics
Small Parts
Ceramics
Automotive
Biotech and nano-devices
Metal
Electrical/Electronics
Tooling
PCB
Connectors
BGA
Small Parts
Surfaces
Plastics
Automotive
Biotech and nano-devices
Optical devices and lenses
Metal
Electrical/Electronics
Tooling
PCB
Connectors
BGA
Small Parts
SpecificationsView SpecificationsView SpecificationsView Specifications

Mid-Range Optical Profilometry: An Overview

Profilometry for surface characterization and dimensioning is a key area of expertise for Covalent Metrology and is proving invaluable to customers across a wide range of applications. The purpose of this paper is to discuss the technology behind each of the three optical profilometry techniques Covalent Metrology offers and to discuss the relative advantages of each of them.