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Scanning Electron Microscopy with Focused Ion Beam Services

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Combined SEM and FIB analysis for high-resolution material characterization (Covalent Metrology).

Deepen your microanalytical work with ultra-high-resolution imaging provided at fast and reliable turnaround times. Covalent relies on top-of-line DualBeam electron microscopy instruments that enable advanced data processing, artifact removal, and presentation-ready reporting features. Correlate structural and topographic information with spectroscopic data for element mapping in 2D scans and 3D reconstructions of your sample.

The Scanning Electron Microscopy group makes partnership efficient and easy so you can probe these deeper insights with powerful analytical tools and world-class expertise.

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com