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Measurement
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We are a state-of-the-art materials characterization company staffed by world-class scientists and engineers.
Covalent Metrology is a modern materials characterization company staffed by world-class scientists and engineers
JOIN OUR COVALENT ACADEMY WEBINARS
Covalent Metrology invites you to attend the 14th episode of our Covalent Academy webinar series, presented by Covalent’s own Dr. Max Junda (Senior Member of Technical Staff, Optical Characterization Lab).
Spectroscopic Ellipsometry is a powerful and highly sensitive metrology technique. However, unlocking its full potential requires more than collecting sound data. Nearly all results are only obtained after fitting optical models to the measurements; a sometimes-challenging process with significant repercussions for analytical accuracy.
In this episode, we will discuss the many considerations and strategies that go into developing appropriate optical models for a variety of spectral ellipsometry applications.
The event, Shining a Light on Optical Modeling for Spectral Ellipsometry, will be aired live on August 6, 2020 at 11am PDT.
Past episodes can be accessed by registrants through our Community.
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Complimentary Sample Pick-Up and Drop-Off
Now it’s easier than ever to access great testing services! Schedule sample pick-up or drop-off now and our “Little Blue” Prius will come to you!
We provide free local sample pick-up and drop off in the San Francisco Bay area for all jobs over $1,000, and will courier other samples for a small service fee. Give us a call with any questions, or schedule online and one of our commercial team members will be in touch with you soon.
Pricing: Analytical Services
Characterization, Imaging & Measurement Services
- Our pricing is usually 20-30% lower than leading competitors
- No price premiums, even when we can get you data the same day
| Application | Technique | Instrument | Pricing starts @ |
|---|---|---|---|
| Crystallinity, composition and residual stress: Thin films, bulk & other low texture materials | XRD: Qual. Phase ID | Rigaku Smartlab | $380 / sample |
| XRD: Crystallinity, Crystallite Size OR Texture Analysis | Rigaku Smartlab | $3801 / sample | |
| – 2 of 3 above | Rigaku Smartlab | $6001 / sample | |
| – All 3 above | Rigaku Smartlab | $8001 / sample | |
| XRD: Quant. Phase ID | Rigaku Smartlab | $600 / sample | |
| XRD: Residual Stress | Rigaku Smartlab | $380 / sample | |
Orientation, composition, quality and residual stress: Epitaxial films, single crystals & other high texture materials | XRD: Pole Figures | Rigaku Smartlab | $400 / sample |
| XRD: Offcut | Rigaku Smartlab | $400 / sample | |
| XRD: Residual Stress | Rigaku Smartlab | $6002 / sample | |
| XRD: Rocking Curves, Quality (per plane) | Rigaku Smartlab | $5002 / sample | |
| XRD: Rocking Curves, Composition & Thickness (per plane) | Rigaku Smartlab | $7002 / sample | |
| Thickness, density, interfacial roughness | XRR | Rigaku Smartlab | $500 / sample |
| Optical constants, thickness | Spectral Ellipsometry, Mapping, 10-point | Woollam VASE 2000 DI | $250 / sample |
| Spectral Ellipsometry, Variable Angle, Single-point | Woollam VASE 2000 DI | $125 / sample | |
| Optical transmission, reflection | UV-VIS-NIR Spectrophotometry | Perkin Elmer 1050 | $125 / sample3 |
Surface Topography / Roughness Critical Dimension Analysis Step Heights / Thicknesses | Laser Confocal | Keyence VK-X1100 | $300 / hour |
| White Light Interferometry | Zygo ZeGage Plus | $225 / hour | |
| Wide-area 3D measurement | Keyence VR-3200 | $225 / hour | |
| Keyence VR-5200 | $275 / hour | ||
| Advanced Optical Microscopy | Keyence VHX-S660E | $225 / hour | |
| AFM / SPM: Roughness / Topography | Bruker Dimension Icon/FastScan | $175 / image4 | |
| AFM: Advanced Modes (KPFM) | Bruker Dimension Icon/FastScan | $475 / hour | |
| μ-CT | Rigaku CT Lab HX130 | Please contact us | |
| Chromatic Dispersion Profilometry | FRT | $360 / hour | |
| SEM | Hitachi 4700 | $225 / hour | |
| HR-SEM | Thermo Fisher G5 FEI Scios DB (magnetic sample) | $375 / hour | |
Large Area SEM (up to 15”) | FEI Expida 1265 | $325 / hour | |
Environmental SEM (temp cont, CL) | FEI Quanta ESEM | $325 / hour | |
Cross sectional analysis: Structure, thicknesses, interfaces, composition | SEM + EDX/EDS | Hitachi 4700 w/ EDAX 70mm Octane Elect Si Drift Detector | $275 / hour |
| FIB-HR-SEM | Thermo Fisher G5 FEI Scios DB (magnetic sample) | $375 / hour | |
| FIB-HR-SEM + EDX/EDS | $400 / hour | ||
| TEM (include sample prep) | Thermo Fisher Talos FEI Tecnai | $850 / sample | |
| TEM + EDX/EDS | $1250 / sample | ||
| TEM + EELS | $1500 / sample5 | ||
| Hardness, adhesion, coefficient of friction, stress | Nano-Indent | Bruker Hysitron TI Prem | $300 / sample |
| Scratch | $450 / sample | ||
| Wear-box | $700 / sample | ||
| Particle size / location | Particle Counter (SP1) | SurfScan SP1 | $225 / wafer |
| Particle Counter (SP3) | SurfScan SP3 | $400 / wafer | |
| Particle size distribution | Dynamic Light Scattering (DLS) | Litesizer 500 | $325 / wafer |
| Particle Size Analysis (PSA) | PSA 1190LD | $150 / sample# | |
| Rheology | Viscosity & Rheological Properties | Rheometer MCR 302 | $350 / wafer |
| Zeta Potential | Colloidal Dispersion | Litesizer 500 | $300 / sample# |
| Solid Surface | SurPASS 3 | $300 / sample# | |
| Polymer Analysis | TGA | TA Instruments Q600 or equivalent | $300 / sample |
| DSC | TA Instrument DSC-2920 | $300 / sample | |
| TMA | TA Instrument Q400 | Please contact us | |
| DMA | TA Instrument Q800 | Please contact us | |
| FTIR Microscope (Ge/Diamond-C Crystal) | Thermo Fisher Nicolet 6700 | $225 / sample | |
| TGA-FTIR | Perkin Elmer, TA Inst. | $600 / sample | |
| Pyrolysis FTIR | Perkin Elmer, CDS pyrolyzer | $250 / sample | |
| Surface & Bulk Compositional Analysis | XPS-Survey | Thermo Scientific Nexsa or equivalent | $365 / sample6 |
| XPS-Survey Hi Res | $730 / sample6 | ||
| XPS-Depth Profile | $1095 / sample | ||
| XPS-Mapping | $1460 / sample | ||
| XPS-ISS | $365 / sample | ||
| XPS-UPS (Valence Band) | Please contact us | ||
| XPS-UPS (Band Gap Measurement) | Please contact us | ||
| TOF-SIMS | ION-TOF Model IV | Please contact us | |
| TOF-SIMS | PHI | $800 / hour | |
| EPMA-Basic | Cameca SX100 | $325 / sample | |
| EPMA-Complete | $650 / sample | ||
| Auger | Custom | $335 / hour | |
| Auger-Higher-end scanning | PHI 710 | $650 / hour | |
| WDXRF-Survey scan Quantification | Rigaku AZX400 | $400 / hour7 | |
| Elemental & Chemical Analysis | NMR: Liquid | Bruker Avance III-HD 500 MHz NMR & Others | $80/ sample |
| NMR: Solid | Bruker Avance III-HD 600 MHz NMR Spectrometer | $700 / sample | |
| FTIR | Nicolet 6700 and others | $225 / sample | |
| ATR-FTIR | Perkin Elmer Optima | $175 / sample | |
| ICPMS / ICP-OES | $350 / prep $450 / sample | ||
| LA-ICPMS | Contact us | $700 / sample | |
| GD-MS | Contact us | $600 / sample | |
| Pyrolysis & Thermal Desorption GCMS | Agilent 7890GC with 5975 MS | $390 / sample |
* For standard jobs in these techniques, which is determined at quote issuance
1 If given accurate qualitative phase ID
2 If given crystallographic orientation
3 Minimum 3 images at this price
4 Minimum 4 samples at this price
12: Copyright Covalent Metrology, 2019
Insights beyond raw data
We have world-class metrologists working side-by-side with accomplished engineers & scientists in a high-touch & quality-centric way
Our customer engagement model is superior. We work to:
- Understand your goals and problem statement — clearly and precisely
- Make thoughtful recommendations regarding both effectiveness AND economics
- Generate great data on high-quality, calibrated and well-maintained instruments
- Meet to review & interpret results and then assist you in thinking through next steps
As a material characterization services company, our mission is to help with your characterization, measurement, and imaging work as a trusted partner in achieving your objectives. Whether discussing data on a standard sample or helping on complex consulting engagements, we bring insight and experience.
Flexible services
We have a variety of programs to address the different needs of our customers
-
Membership pricing
Pre-purchase in bulk to get pricing well below our already competitive “standard” prices. -
Co-op programs
Let Covalent host and/or operate your instruments. A smart option when considering buying new instruments or for managing tools you own that are underutilized, expensive or difficult to operate/maintain. Covalent’s customers get better results for less CAPEX + OPEX, while maintaining preferred access. -
consulting services
Leverage Covalent professionals to provide specific expertise or even stand in for in-house Metrology functions. -
Custom bundles
Solve your toughest problems with custom contracts combining Consulting Services with bulk-priced Sample Testing.
Latest News
Latest News
Covalent Metrology Announces New FIB-SEM Services with Significant Advances in Imaging Resolution
... Read More
Covalent Metrology Installs Advanced Surface Analysis Instrument from Thermo Scientific
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Upcoming and Recent Events
August 4, 2020 – Covalent’s Chris Moore, Vice President Technology to present at Rigaku’s Virtual Analytical X-Ray Convention, “Technology Insights & Trends Across the Metrology and Material Characterization Industry”
May 28, 2020 – NCCAVS Thin Film Users Group (TFUG) Virtual Meeting 2:45 pm: X-Ray Diffraction From the Easy to the Hard. Featuring Chris Moore, VP Technology at Covalent Metrology
February 4-6, 2020 – APEX EXPO IPC 2020
IPC APEX EXPO is the largest event for electronics manufacturing in North America with more than 9,000 professionals from 45 countries.
Dec. 4, 2019—SMTA Silicon Valley Chapter
Covalent Metrology is showcasing it’s failure analysis and materials characterization services to the SMTA community
Covalent Metrology will be exhibiting at the IDTechEX to showcase its characterization services for the the latest trends happening in Materials, Manufacturing and Component Innovation.
Nov. 5-7, 2019—MicroTech Innovation Summit 2019
Craig Hunter, Covalent Metrology CEO, is a Technology Innovation Showcase Presenter on “Metrology and Characterization: Emerging Techniques for MEMS and Sensors Devices.”
Latest Publications
Atomic Force Microscopy for Advanced Optical Components
New applications for optical components place ever-higher demands on surface roughness and finish specifications. Current generation atomic force microscopy (AFM) techniques provide accurate 3D images with sub-angstrom accuracy in less than a minute. These advancements make AFM ideal for applications requiring more detailed information than available with optical interferometry techniques.
Mid-Range Optical Profilometry: An Overview
Profilometry for surface characterization and dimensioning is a key area of expertise for Covalent Metrology and is proving invaluable to customers across a wide range of applications. At Covalent Metrology, profilometry covers a complete range of surface features using everything from atomic force microscopy (AFM) to optical systems to mechanical stylus systems. The purpose of this paper is to discuss the technology behind each of the three optical profilometry techniques Covalent Metrology offers and to discuss the relative advantages of each of them.contact us now