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The Covalent Way

Culture of Partnership

Elevate your R&D and accelerate innovation

Partnership is at the heart of our mission to make cutting-edge analytical capabilities available to scientists, engineers, and companies of all sizes and developmental stages.

Covalent’s Silicon Valley analytical services labs hosts over 30 cutting-edge instruments and we partner with some of the world’s top instrument manufacturers and partner labs to ensure you have the expertise and data necessary to solve your most complex challenges.

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Covalent Community Culture of Partnership
Culture of Partnership
Culture of Partnership
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Catalog Data and Solutions
Data and Solutions

Data and Solutions

Access accurate data AND deep insights

For projects where you need good data fast, we will deliver accurate measurements with quick turnaround times at affordable costs.

For complex challenges that require deeper insights: Covalent’s world-class scientists and engineers will deliver advanced analysis and help you uncover the appropriate solution.

Holistic Analytical Services

Tap into services beyond sample analysis

Covalent is ready to meet all your metrology, material characterization and advanced analytical needs, both within and beyond the lab, by providing:

  • Custom consulting solutions
  • Certified technician support to your site
  • User training and certification on instrumentation
  • Co-op and Tool-Share opportunities
  • Tool rental programs
  • Laboratory audits

Take advantage of Covalent’s cost-effective characterization services, by integrating our experts into your R&D process: customized subscription and membership programs are available.

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Catalog Holistic Analytical Services
Holistic Analytical Services
Holistic Analytical Services
Holistic Analytical Services

A New, Comprehensive Metrology Platform

Covalent Metrology provides the advanced tools and team to expedite and enhance your R&D success.

What Our Clients Are Saying

Our Strategic Instrument Partners

Thermo Scientific
Anton Paar
J.A. Woollam Co.
PVA TePla
Oxford Instruments Asylum Research
Rigaku

Covalent Academy Webinars

The Covalent Academy is an ongoing webinar series, featuring technical experts from the Covalent team, strategic partners and clients who discuss the latest advancements in technique applications and instrumentation.

Join our community of learners and build your materials characterization knowledge!
Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2

Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2

April 22nd, 2021 at 11:00 AM PT

In this webinar episode, our  Vice President of Technology, Dr. Chris Moore, will outline effective strategies for identifying the right analysis for your project and so you can extract the most impact from your data. Using two case studies, he’ll demonstrate how partnering with the right metrology team can lead to major advantages throughout the...

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Let’s talk about your project and goals!

Covalent Metrology is ready to serve you with our comprehensive platform of techniques and services, even during COVID 19. Reach out to our friendly team of experts to start a conversation about how we can help your team achieve your materials characterization goals.

Tell us a bit about your project or problem and we’ll be in touch soon!

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Latest news, events
& announcements

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Recommended Strategies for Wafer Offcut Measurement in Thin Film Applications Using X-ray Diffraction (XRD)
Recommended Strategies for Wafer Offcut Measurement in Thin Film Applications Using X-ray Diffraction (XRD)
March 30, 2021

When growing epitaxial thin films on substrate wafers, it is advantageous to know their offcut angle: the angular tilt between the polished wafer surface and its crystallographic planes. In many cases where engineers are challenged to improve and control the quality of epitaxial films, this property may be overlooked; however, the optimal offcut angle will […]

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Covalent Metrology, Anton Paar USA expand surface analysis partnership with nanoindenter offering
Covalent Metrology, Anton Paar USA expand surface analysis partnership with nanoindenter offering
March 25, 2021

Covalent Metrology has expanded its Anton Paar portfolio with the addition of a new STeP6 surface characterization platform.

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Reflections on 2020, and a Look Ahead to a Brighter New Year
Reflections on 2020, and a Look Ahead to a Brighter New Year
January 11, 2021

Before bidding a final and much-anticipated “good riddance” to 2020, I would like to thank our customers, partners, and investors on behalf of the entire team here at Covalent Metrology for supporting us through such a difficult year. Like so many other companies, Covalent encountered unforeseen and substantial headwinds over most of this past year.  […]

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Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2
Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2
March 24, 2021

Engineers trying to optimize their processes and materials in the real world often find the undertaking is fraught with difficulties that can lead down time-leeching expensive dead ends in testing and analysis. Everyone understands that time to market is a key driver of success or failure of any project or product and, in many cases, it can make […]

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Energizing Research in Battery Performance with Advanced AFM
Energizing Research in Battery Performance with Advanced AFM
February 23, 2021

Modern day battery technologies are constantly improving. In addition to broader efforts to increase life-span and energy density, batteries are also diversifying to support a broadening array of applications: photovoltaics and green energy installations, consumer electronics, electric vehicles, railway industries, manufacturing sectors, and more. In a recent market analysis report, Grand View Research projected that […]

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3D Tomography Using the DualBeam (SEM-FIB): Imaging, EDS and EBSD
3D Tomography Using the DualBeam (SEM-FIB): Imaging, EDS and EBSD
December 10, 2020

This webinar will introduce 3D tomography using the DualBeam platform, including the plasma and liquid metal ion sources (LMIS). Sample preparation, automated data collection and data reconstruction will be discussed. 3D tomography reconstruction examples will be shown for imaging, EDS and EBSD at both the Gallium Ion Beam and the Xenon plasma FIB scale. The esteemed presenters will focus on: What […]

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E-Book: Surface Spectroscopic Techniques for Chemical Analysis
E-Book: Surface Spectroscopic Techniques for Chemical Analysis
December 30, 2020
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