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Your Trusted Partner
Measurement Characterization imaging

We are a state-of-the-art materials characterization company staffed by world-class scientists and engineers.

  • We provide characterization, imaging, and measurement services of advanced materials and devices
  • We also perform mechanical cross-sectioning, metallography and PCBA analysis
  • We offer consulting services to solve problems from lab to fab

Covalent Metrology is a modern materials characterization company staffed by world-class scientists and engineers

JOIN OUR NEW COVALENT ACADEMY WEBINARS


We’re excited to welcome you to our new weekly webinar series called Covalent Academy!

Our past webinars include:

New Covalent Car for
local pick up and drop off!
San Francisco Bay Area Exclusive Service

Covalent Metrology Car Prius

We’re committed to providing the best data and customer service to you as a valued customer.
To deliver on our promise, we’re making it easier than ever to pick up and drop off your samples. 

Pricing: Analytical Services

Characterization, Imaging & Measurement Services

  • Our pricing is usually 20-30% lower than leading competitors
  • No price premiums, even when we can get you data the same day
Application Technique Instrument Pricing starts @
Crystallinity, composition and residual stress: Thin films, bulk & other low texture materials XRD: Qual. Phase ID Rigaku Smartlab $380 / sample
XRD: Crystallinity, Crystallite Size OR Texture Analysis Rigaku Smartlab $3801 / sample
– 2 of 3 above Rigaku Smartlab $6001 / sample
– All 3 above Rigaku Smartlab $8001 / sample
XRD: Quant. Phase ID Rigaku Smartlab $600 / sample
XRD: Residual Stress Rigaku Smartlab $380 / sample
Orientation, composition, quality and residual stress: Epitaxial films, single crystals & other high texture materials XRD: Pole Figures Rigaku Smartlab $400 / sample
XRD: Offcut Rigaku Smartlab $400 / sample
XRD: Residual Stress Rigaku Smartlab $6002 / sample
XRD: Rocking Curves, Quality (per plane) Rigaku Smartlab $5002 / sample
XRD: Rocking Curves, Composition & Thickness (per plane) Rigaku Smartlab $7002 / sample
Thickness, density, interfacial roughness XRR Rigaku Smartlab $500 / sample
Optical constants, thickness Spectral Ellipsometry, Mapping, 10-point Woollam VASE 2000 DI $250 / sample
Spectral Ellipsometry, Variable Angle, Single-point Woollam VASE 2000 DI $125 / sample
Optical transmission, reflection UV-VIS-NIR Spectrophotometry Perkin Elmer 1050 $125 / sample3
Surface Topography / Roughness Critical Dimension Analysis Step Heights / Thicknesses Laser Confocal Keyence VK-X1100 $300 / hour
White Light Interferometry Zygo ZeGage Plus $225 / hour
Wide-area 3D measurement Keyence VR-3200 $225 / hour
Keyence VR-5200 $275 / hour
Advanced Optical Microscopy Keyence VHX-S660E $225 / hour
AFM / SPM: Roughness / Topography Bruker Dimension Icon/FastScan $175 / image4
AFM: Advanced Modes (KPFM) Bruker Dimension Icon/FastScan $475 / hour
μ-CT Rigaku CT Lab HX130 Please contact us
Chromatic Dispersion Profilometry FRT $360 / hour
SEM Hitachi 4700 $225 / hour
HR-SEM Thermo Fisher G5 FEI Scios DB (magnetic sample) $375 / hour
Large Area SEM (up to 15”) FEI Expida 1265 $325 / hour
Environmental SEM (temp cont, CL) FEI Quanta ESEM $325 / hour
Cross sectional analysis: Structure, thicknesses, interfaces, composition SEM + EDX/EDS Hitachi 4700 w/ EDAX 70mm Octane Elect Si Drift Detector $275 / hour
FIB-HR-SEM Thermo Fisher G5 FEI Scios DB (magnetic sample) $375 / hour
FIB-HR-SEM + EDX/EDS $400 / hour
TEM (include sample prep) Thermo Fisher Talos FEI Tecnai $850 / sample
TEM + EDX/EDS $1250 / sample
TEM + EELS $1500 / sample5
Hardness, adhesion, coefficient of friction, stress Nano-Indent Bruker Hysitron TI Prem $300 / sample
Scratch $450 / sample
Wear-box $700 / sample
Particle size / location Particle Counter (SP1) SurfScan SP1 $225 / wafer
Particle Counter (SP3) SurfScan SP3 $400 / wafer
Particle size distribution Dynamic Light Scattering (DLS) Litesizer 500 $325 / wafer
Particle Size Analysis (PSA) PSA 1190LD $150 / sample#
Rheology Viscosity & Rheological Properties Rheometer MCR 302 $350 / wafer
Zeta Potential Colloidal Dispersion Litesizer 500 $300 / sample#
Solid Surface SurPASS 3 $300 / sample#
Polymer Analysis TGA TA Instruments Q600 or equivalent $300 / sample
DSC TA Instrument DSC-2920 $300 / sample
TMA TA Instrument Q400 Please contact us
DMA TA Instrument Q800 Please contact us
FTIR Microscope (Ge/Diamond-C Crystal) Thermo Fisher Nicolet 6700 $225 / sample
TGA-FTIR Perkin Elmer, TA Inst. $600 / sample
Pyrolysis FTIR Perkin Elmer, CDS pyrolyzer $250 / sample
Surface & Bulk Compositional Analysis XPS-Survey Thermo Scientific Nexsa or equivalent $365 / sample6
XPS-Survey Hi Res $730 / sample6
XPS-Depth Profile $1095 / sample
XPS-Mapping $1460 / sample
XPS-ISS $365 / sample
XPS-UPS (Valence Band) Please contact us
XPS-UPS (Band Gap Measurement) Please contact us
TOF-SIMS ION-TOF Model IV Please contact us
TOF-SIMS PHI $800 / hour
EPMA-Basic Cameca SX100 $325 / sample
EPMA-Complete $650 / sample
Auger Custom $335 / hour
Auger-Higher-end scanning PHI 710 $650 / hour
WDXRF-Survey scan Quantification Rigaku AZX400 $400 / hour7
Elemental & Chemical Analysis NMR: Liquid Bruker Avance III-HD 500 MHz NMR & Others $80/ sample
NMR: Solid Bruker Avance III-HD 600 MHz NMR Spectrometer $700 / sample
FTIR Nicolet 6700 and others $225 / sample
ATR-FTIR Perkin Elmer Optima $175 / sample
ICPMS / ICP-OES $350 / prep $450 / sample
LA-ICPMS Contact us $700 / sample
GD-MS Contact us $600 / sample
Pyrolysis & Thermal Desorption GCMS Agilent 7890GC with 5975 MS $390 / sample

* For standard jobs in these techniques, which is determined at quote issuance

1 If given accurate qualitative phase ID

2 If given crystallographic orientation

3 Minimum 3 images at this price

4 Minimum 4 samples at this price

12: Copyright Covalent Metrology, 2019

Insights beyond raw data

We have world-class metrologists working side-by-side with accomplished engineers & scientists in a high-touch & quality-centric way

Our customer engagement model is superior. We work to:

  • Understand your goals and problem statement — clearly and precisely
  • Make thoughtful recommendations regarding both effectiveness AND economics
  • Generate great data on high-quality, calibrated and well-maintained instruments
  • Meet to review & interpret results and then assist you in thinking through next steps

As a material characterization services company, our mission is to help with your characterization, measurement, and imaging work as a trusted partner in achieving your objectives. Whether discussing data on a standard sample or helping on complex consulting engagements, we bring insight and experience.

Flexible services

We have a variety of programs to address the different needs of our customers

  • Membership pricing

    Pre-purchase in bulk to get pricing well below our already competitive “standard” prices.
  • Co-op programs

    Let Covalent host and/or operate your instruments. A smart option when considering buying new instruments or for managing tools you own that are underutilized, expensive or difficult to operate/maintain. Covalent’s customers get better results for less CAPEX + OPEX, while maintaining preferred access.
  • consulting services

    Leverage Covalent professionals to provide specific expertise or even stand in for in-house Metrology functions.
  • Custom bundles

    Solve your toughest problems with custom contracts combining Consulting Services with bulk-priced Sample Testing.

Upcoming and Recent Events

May. 28, 2020 —NCCAVS Thin Film Users Group (TFUG) Virtual Meeting

2:45 pm: X-Ray Diffraction From the Easy to the Hard

Featuring Chris Moore, VP Technology at Covalent Metrology 

Feb. 4-6, 2020—APEX EXPO IPC 2020

IPC APEX EXPO is the largest event for electronics manufacturing in North America with more than 9,000 professionals from 45 countries.

Dec. 4, 2019—SMTA Silicon Valley Chapter

Covalent Metrology is showcasing it’s failure analysis and materials characterization services to the SMTA community

Nov. 20-21, 2019—IDTechEX

Covalent Metrology will be exhibiting at the IDTechEX to showcase its characterization services for the the latest trends happening in Materials, Manufacturing and Component Innovation. 

Nov. 5-7, 2019—MicroTech Innovation Summit 2019

Craig Hunter, Covalent Metrology CEO, is a Technology Innovation Showcase Presenter on “Metrology and Characterization: Emerging Techniques for MEMS and Sensors Devices.”

Latest Publications

Atomic Force Microscopy for Advanced Optical Components

New applications for optical components place ever-higher demands on surface roughness and finish specifications. Current generation atomic force microscopy (AFM) techniques provide accurate 3D images with sub-angstrom accuracy in less than a minute. These advancements make AFM ideal for applications requiring more detailed information than available with optical interferometry techniques.

Mid-Range Optical Profilometry: An Overview

Profilometry for surface characterization and dimensioning is a key area of expertise for Covalent Metrology and is proving invaluable to customers across a wide range of applications. At Covalent Metrology, profilometry covers a complete range of surface features using everything from atomic force microscopy (AFM) to optical systems to mechanical stylus systems. The purpose of this paper is to discuss the technology behind each of the three optical profilometry techniques Covalent Metrology offers and to discuss the relative advantages of each of them.

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