Covalent 48-hour guarantee*
48-Hour Guarantee* without Premiums or “Rush pricing”
Our 48-Hour Guarantee* applies to standard measurements of the following techniques:
|White Light Interferometry||Yes|
|Patterned Light / Wide Area 3D Measurement||Yes|
|Laser Confocal Microscopy||Yes|
|Advanced Optical Microscopy||Yes|
For our measurement and imaging services not under the 48-Hour Guarantee* we still normally turn samples in a week or less.
*48-Hour = 2 business days. The Guarantee applies under conditions to be met for “Standard Measurement” as well as of acceptance of the order by Covalent Metrology. “Standard Measurement” designation will be made clear at quote – large sample volumes or applications that require some development may be excluded, this will be disclosed and discussed in advance. Call us for more information on any of our measurement and imaging services that are eligible for our “48-Hour Guarantee”.
Pricing: Analytical Services
Characterization, Imaging & Measurement Services
Insights beyond raw data
We have world-class metrologists working side-by-side with accomplished engineers & scientists in a high-touch & quality-centric way
Our customer engagement model is superior. We work to:
- Understand your goals and problem statement — clearly and precisely
- Make thoughtful recommendations regarding both effectiveness AND economics
- Generate great data on high-quality, calibrated and well-maintained instruments
- Meet to review & interpret results and then assist you in thinking through next steps
As a material characterization services company, our mission is to help with your characterization, measurement, and imaging work as a trusted partner in achieving your objectives. Whether discussing data on a standard sample or helping on complex consulting engagements, we bring insight and experience.
We have a variety of programs to address the different needs of our customers
Membership pricingPre-purchase in bulk to get pricing well below our already competitive “standard” prices.
Co-op programsLet Covalent host and/or operate your instruments. A smart option when considering buying new instruments or for managing tools you own that are underutilized, expensive or difficult to operate/maintain. Covalent’s customers get better results for less CAPEX + OPEX, while maintaining preferred access.
consulting servicesLeverage Covalent professionals to provide specific expertise or even stand in for in-house Metrology functions.
Custom bundlesSolve your toughest problems with custom contracts combining Consulting Services with bulk-priced Sample Testing.
Upcoming and Recent Events
Feb. 4-6, 2019—APEX EXPO IPC 2020
IPC APEX EXPO is the largest event for electronics manufacturing in North America with more than 9,000 professionals from 45 countries.
Dec. 4, 2019—SMTA Silicon Valley Chapter
Covalent Metrology is showcasing it’s failure analysis and materials characterization services to the SMTA community
Covalent Metrology will be exhibiting at the IDTechEX to showcase its characterization services for the the latest trends happening in Materials, Manufacturing and Component Innovation.
Nov. 5-7, 2019—MicroTech Innovation Summit 2019
Craig Hunter, Covalent Metrology CEO, is a Technology Innovation Showcase Presenter on “Metrology and Characterization: Emerging Techniques for MEMS and Sensors Devices.”
Atomic Force Microscopy for Advanced Optical Components
New applications for optical components place ever-higher demands on surface roughness and finish specifications. Current generation atomic force microscopy (AFM) techniques provide accurate 3D images with sub-angstrom accuracy in less than a minute. These advancements make AFM ideal for applications requiring more detailed information than available with optical interferometry techniques.
Mid-Range Optical Profilometry: An OverviewProfilometry for surface characterization and dimensioning is a key area of expertise for Covalent Metrology and is proving invaluable to customers across a wide range of applications. At Covalent Metrology, profilometry covers a complete range of surface features using everything from atomic force microscopy (AFM) to optical systems to mechanical stylus systems. The purpose of this paper is to discuss the technology behind each of the three optical profilometry techniques Covalent Metrology offers and to discuss the relative advantages of each of them.