In: Material Property Testing

Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data,...

In: Electron Microscopy

Like other high-resolution scanning electron microscopes, Focused-ion-beam scanning electron microscopes (FIB-SEMs) are used to produce 2D and 3D...

In: Optical Analysis

Laser scanning confocal microscopy (also called "VK" or "VKX" after the instrument used) is a nondestructive technique that...

In: Optical Analysis

X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, non-destructive 2D...

In: Scanning Probe Techniques

In: Electron Microscopy

Scanning electron microscopy (SEM) is a surface imaging technique that achieves nanometer-scale resolution: orders of magnitude smaller than...

In: Electron Microscopy

Transmission electron microscopy (TEM) provides atomic-level spatial resolution limits to image the morphology of complex nanostructures.

In: Optical Analysis

Wide Area 3D Patterned Light measurements encompass optical profilometry techniques used to map surface height on large/oversized samples.