Covalent Metrology is an advanced materials science and analytical services platform headquartered in the heart of Silicon Valley.
We have a proven track record of helping scientists and engineers from many of the most influential companies in the world better understand the optical, chemical, physical, and electrical properties of their new products and technologies. Covalent Metrology succeeds through a unique combination of cutting-edge analytical instruments and a world-class team of scientists: enabling us to provide our clients actionable, accurate and affordable data and insights to accelerate the development of product and technology innovations.
Together with our strategic partners and clients, we are pushing the boundaries of materials science to develop new products and services that will revolutionize the industry as we know it. It is Covalent Metrology’s mission to ensure that every company, no matter the size, has access to the data and expertise they need to science forward – faster, affordably and with confidence.
Recommended Strategies for Wafer Offcut Measurement in Thin Film Applications Using X-ray Diffraction (XRD)
March 30, 2021
When growing epitaxial thin films on substrate wafers, it is advantageous to know their offcut angle: the angular tilt between the polished wafer surface and its crystallographic planes. In many cases where engineers are challenged to improve and control the quality of epitaxial films, this property may be overlooked; however, the optimal offcut angle will […]
Reflections on 2020, and a Look Ahead to a Brighter New Year
January 11, 2021
Before bidding a final and much-anticipated “good riddance” to 2020, I would like to thank our customers, partners, and investors on behalf of the entire team here at Covalent Metrology for supporting us through such a difficult year. Like so many other companies, Covalent encountered unforeseen and substantial headwinds over most of this past year. […]
Solving Puzzles Using Metrology: Case Studies in Troubleshooting when (1+1)>2
March 24, 2021
Engineers trying to optimize their processes and materials in the real world often find the undertaking is fraught with difficulties that can lead down time-leeching expensive dead ends in testing and analysis. Everyone understands that time to market is a key driver of success or failure of any project or product and, in many cases, it can make […]
Energizing Research in Battery Performance with Advanced AFM
February 23, 2021
Modern day battery technologies are constantly improving. In addition to broader efforts to increase life-span and energy density, batteries are also diversifying to support a broadening array of applications: photovoltaics and green energy installations, consumer electronics, electric vehicles, railway industries, manufacturing sectors, and more. In a recent market analysis report, Grand View Research projected that […]
3D Tomography Using the DualBeam (SEM-FIB): Imaging, EDS and EBSD
December 10, 2020
This webinar will introduce 3D tomography using the DualBeam platform, including the plasma and liquid metal ion sources (LMIS). Sample preparation, automated data collection and data reconstruction will be discussed. 3D tomography reconstruction examples will be shown for imaging, EDS and EBSD at both the Gallium Ion Beam and the Xenon plasma FIB scale. The esteemed presenters will focus on: What […]
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