Covalent Metrology is an advanced materials science and analytical services platform headquartered in the heart of Silicon Valley.
We have a proven track record of helping scientists and engineers from many of the most influential companies in the world better understand the optical, chemical, physical, and electrical properties of their new products and technologies. Covalent Metrology succeeds through a unique combination of cutting-edge analytical instruments and a world-class team of scientists: enabling us to provide our clients actionable, accurate and affordable data and insights to accelerate the development of product and technology innovations.
Together with our strategic partners and clients, we are pushing the boundaries of materials science to develop new products and services that will revolutionize the industry as we know it. It is Covalent Metrology’s mission to ensure that every company, no matter the size, has access to the data and expertise they need to science forward – faster, affordably and with confidence.
Nanoscale Secondary Ion Mass Spectroscopy (NanoSIMS) is a unique analytical method which combines the extremely high sensitivity and mass resolution of SIMS with an improved optical design that facilitates high lateral resolution (as low as 50 nm): up to 50 times greater than conventional SIMS. This facilitates targeting of microscopic grains and structures in materials […]
Gas sorption analysis helps to drive rapid advancement and commercialization of innovative materials and climate solutions. It is used to track and control the quality of raw materials, and to optimize performance in products related to many climate applications. In this webinar, guest speaker Martin Thomas, PhD, from Anton Paar will be exploring a variety […]
There has been increasing demand for so-called ‘workhorse’-type transmission electron microscopes as the technologies and techniques in (scanning) transmission electron microscopy (S/TEM) have evolved. Researchers and engineers from diverse industries depend on the unparalleled spatial resolution of S/TEM imaging for key structural insight into novel nanomaterials and devices, spurring recent developments of more flexible, reliable […]
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