AFM Polymer Surface Characterization
Using Tosca series atomic force microscopes to characterize polymer blends in terms of high-resolution morphology and polymer distribution.
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The surface properties of polymeric materials are central to their behavior in formulation and manufacturing processes, as well as in their target applications.
Tosca AFM is a powerful tool for characterizing polymer surfaces at the nanoscale. It provides not only surface morphology, but also phase contrast between different components in polymer blends in highest resolution.
About Anton Paar USA
Anton Paar USA is a subsidiary of the Graz, Austria-based Anton Paar. Anton Paar is the world’s premier manufacturer of measuring and analytical instrumentation used by laboratories and manufacturers during both research and development and quality control. Founded in 1922, Anton Paar now has subsidiaries in 31 different countries across the world.
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