Microscopy & Imaging

17 techniques found
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Transmission Electron Microscopy
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging
Base Price: $850 per Sample

TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.

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Scanning Electron Microscopy
Scanning Electron Microscopy (SEM)
In Microscopy & Imaging
Base Price: $275 per Hour

Scanning electron microscopy (SEM) is a surface imaging technique capable of achieving nm resolution on topographical features. Additionally, all Covalent instruments are also outfitted with energy dispersive spectroscopy (EDS) detectors to capture quantitative elemental composition measurements, as well as 2D elemental maps, in addition to conventional SEM images.

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Focused Ion Beam Scanning Electron Microscopy
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
Base Price: $425 per Hour

FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve nm-scale features on a sample surface. In addition to standard SEM capabilities, the inclusion of the focused-ion-beam also allows for in situ sample manipulation.

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Micron-spot Energy Dispersive X-ray Fluorescence Spectroscopy
Micron-spot Energy Dispersive X-ray Fluorescence Spectroscopy (Micro-EDXRF)
In Microscopy & Imaging
please contact us for pricing

EDXRF is a fast, nondestructive spectroscopy technique used to determine the elemental composition of a near-surface volume, and to compute thin film thickness in a multilayer stack. Uniquely available at Covalent is one of the first EDXRF systems ever to incorporate a micron-scale beam spot, as well as integrated hybrid sensor systems to accelerate data collection.

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X-ray Computed Tomography
X-ray Computed Tomography (Micro-CT)
In Microscopy & Imaging
Base Price: $400 per Hour

X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D / 3D imaging technique used to capture morphology and topography at the micron scale of the exterior and interior of the sample. It produces a 3D model which can be quantitatively measured to analyze critical dimensions of surface and subsurface components.

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AFM: Advanced Modes
AFM: Advanced Modes
In Microscopy & Imaging
Base Price: $475 per Hour

AFM measures surface topography and certain material properties with sub-nm vertical resolution and atomic-level force sensitivity.

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Atomic Force Microscopy
Atomic Force Microscopy (AFM)
In Microscopy & Imaging
Base Price: $225 per Image

AFM measures surface topography and certain material properties with sub-nm vertical resolution and atomic-level force sensitivity.

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Laser Scanning Confocal Microscopy
Laser Scanning Confocal Microscopy (LSCM)
In Microscopy & Imaging
Base Price: $300 per Hour

Laser scanning confocal microscopy (LSCM) is a nondestructive technique which generates 2D and 3D images of a sample surface. Nanometer-scale resolution can be achieved, depending on the focusing lens used for the measurement.

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Chromatic Dispersion Profilometry
Chromatic Dispersion Profilometry (CDP)
In Microscopy & Imaging
Base Price: $360 per Hour

Chromatic dispersion profilometry is a non-contact, nondestructive analytical technique used to measure surface topography. It is particularly well suited for large area characterization (e.g. full wafers) requiring high vertical accuracy.

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White Light Interferometry
White Light Interferometry (WLI)
In Microscopy & Imaging
Base Price: $225 per Hour

White light interferometry (WLI) is a nondestructive, non-contact, optical surface topography measurement which uses coherence scanning interferometry to generate 2D and 3D models of surface height.

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Scanning Acoustic Microscopy
Scanning Acoustic Microscopy (SAM)
In Microscopy & Imaging
Base Price: $450 per Hour

Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the sample. The two primary modes of detection are reflection and transmission, and lateral imaging resolution is dependent on the frequency of the transducer and the speed of sound through the material.

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Wide Area 3D Patterned Light Measurement
Wide Area 3D Patterned Light Measurement (VR)
In Microscopy & Imaging
Base Price: $275 per Hour

Wide Area 3D Patterned Light measurements encompass a class of optical profilometry techniques used to visualize the surface topography of larger samples. Unique to this technique, the generated 3D model is compatible for output as a CAD overlay for volumetric comparison in process and part evaluation.

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Advanced Optical Microscopy
Advanced Optical Microscopy (VH Microscope)
In Microscopy & Imaging
Base Price: $225 per Hour

Optical microscopy is ubiquitous in diverse fields within academic research and commercial industries. It is an affordable, rapid analytical imaging technique used to visualize samples. While optical microscopes may be common, many instruments fall far short on performance when compared with the cutting-edge digital microscope systems available at Covalent.

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Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging
Base Price: $850 per Sample

TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.

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Auger Electron Spectroscopy (AES)
Auger Electron Spectroscopy (AES) (Auger)
In Microscopy & Imaging
Base Price: $335 per Hour

Auger electron spectroscopy (AES) is a surface-sensitive analytical technique used to quantify and map the elemental composition of the outermost 2-10 nm of a material. In conjunction with ion beam sputtering, depth profiling can also be done on samples to provide composition as a function of depth as well as layer thicknesses.

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Time of Flight Secondary Ion Mass Spectroscopy
Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS)
In Microscopy & Imaging
Base Price: $800 per Hour

Time of flight secondary ion mass spectroscopy (ToF-SIMS) is a highly surface-specific analytical technique used to qualitatively assess the composition of elements and functional groups within the outermost 1-2 nm of a sample. It is especially well suited to mapping applications and ultra-trace element detection.

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Electron Probe Microanalysis
Electron Probe Microanalysis (EPMA)
In Microscopy & Imaging
Base Price: $325 per Sample

Electron probe microanlysis (EPMA) is a non-destructive technique used for high-sensitivity, quantitative determination of the elemental composition of a material.

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