Particle Analysis

8 techniques found
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Transmission Electron Microscopy
Transmission Electron Microscopy (TEM)
In Particle Analysis
Base Price: $850 per Sample

TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.

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Transmission Electron Microscopy
Transmission Electron Microscopy (TEM)
In Particle Analysis
Base Price: $850 per Sample

TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.

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Scanning Electron Microscopy
Scanning Electron Microscopy (SEM)
In Particle Analysis
Base Price: $275 per Hour

Scanning electron microscopy (SEM) is a surface imaging technique capable of achieving nm resolution on topographical features. Additionally, all Covalent instruments are also outfitted with energy dispersive spectroscopy (EDS) detectors to capture quantitative elemental composition measurements, as well as 2D elemental maps, in addition to conventional SEM images.

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Dynamic Light Scattering
Dynamic Light Scattering (DLS)
In Particle Analysis
Base Price: $350 per Sample

Dynamic light scattering (DLS) provides a nondestructive, indirect measurement of the average size and size distribution of particles and colloids in solutions.

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Laser Diffraction Particle Size Analysis
Laser Diffraction Particle Size Analysis (PSA)
In Particle Analysis
Base Price: $250 per Sample

Particle size analysis (PSA) is an indirect, optical technique used to measure particle size distributions - by equivalent spherical diameter (D10, D50, D90) - in liquid and solid samples.

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Zeta Potential
Zeta Potential
In Particle Analysis
Base Price: $300 per Sample

Zeta potential measures the strength of net charge on particle and solid surfaces. The higher the magnitude of this potential, the stronger the surface interactions (repulsion and/or attraction) will be when the sample contacts other charged materials.

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Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy (STEM)
In Particle Analysis
Base Price: $850 per Sample

TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.

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Thermogravimetric Analysis
Thermogravimetric Analysis (TGA)
In Particle Analysis
Base Price: $300 per Sample

Thermogravimetric analysis (TGA) is used to characterize sample volatility, as well as thermal stability and response. TGA instruments plot weight as a function of temperature and/or time, and analyzing these plots reveals several thermal properties of the material, including (but not limited to): thermal stability, heat resistance, volatility, and vaporization temperatures.

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