Transmission Electron Microscopy (TEM)
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. Different imaging modes on the TEM can target certain types of contrast: amplitude contrast (arising from atomic number and mass/thickness) phase contrast (from quantum phase shifting due to multiple scattered beams’ interference), diffraction contrast (from crystal structure and orientation), and more.