Analytical Chemistry
In any manufacturing industry, it is crucial to know exactly what chemicals you’re working with. Chemical testing labs that provide accurate, quantitative and qualitative chemical analysis enhance your control of the purity and composition of reagents and materials.
Engineers seeking to verify yield and purity for quality control and researchers investigating unknown chemical mixtures can rely on Covalent’s world-class team of analytical chemists and its full suite of spectroscopy instruments to solve problems faster. Covalent and its network of chemical analysis labs will help you identify and quantify elements, functional groups, and compounds with the exacting sensitivity needed for precise analysis of trace contaminants and impurities.
18 techniques found in Analytical Chemistry
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Attenuated Total Reflectance FTIR (ATR-FTIR)
In Analytical Chemistry
Attenuated-total-reflectance (ATR) is a sampling mode which enhances the Fourier Transformed Infrared Spectroscopy (FTIR) signal obtained from sample surfaces, increasing sensitivity and allowing efficient measurements with minimal sample preparation. Like standard FTIR measurements, ATR-FTIR is used for chemical qualification of a sample from raw optical spectra and is often used to determine organic composition.
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Auger Electron Spectroscopy (AES)
In Analytical Chemistry,Microscopy & Imaging,Failure Analysis
Auger electron spectroscopy (AES) is a surface-sensitive analytical technique with high lateral resolution. It is used to quantify and map the elemental composition of the outermost 2-10 nm of a material.
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Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
In Analytical Services,Analytical Chemistry
Dynamic secondary ion mass spectroscopy (D-SIMS) is a technique used to analyze very low concentrations of elements in solid surfaces and thin films. The ability to detect up to ppb levels of trace impurities and dopants in solid materials makes D-SIMS the most sensitive surface analytical technique.
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Electron Probe Microanalysis (EPMA)
In Analytical Chemistry,Microscopy & Imaging
Electron probe microanlysis (EPMA) is a non-destructive technique used for high-sensitivity, quantitative determination of the elemental composition of a material.
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Fourier Transformed Infrared Spectroscopy (FTIR)
In Analytical Chemistry,Failure Analysis
Fourier-transformed infrared spectroscopy (FTIR) is a nondestructive, optical technique used to analyze chemical composition and the optical properties of a material.
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Gas Chromatography Mass Spectroscopy (GCMS)
In Analytical Chemistry
Gas Chromatography-Mass Spectroscopy (GCMS) combines two instrumental systems: a gas chromatograph component where the sample is volatized, followed by a mass spectrometer, which filters the incoming gaseous particles by their mass. This system outputs a quantitative representation of the chemicals present in a sample.
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Glow Discharge Mass Spectroscopy (GDMS)
In Analytical Chemistry
Glow discharge mass spectrometry (GDMS) provides efficient, direct analysis of trace elements in high-purity, conductive / semiconductive materials. While it is not uniformly surface-selective, it incorporates time-dependent ablation of surface atomic layers and makes an excellent depth profiling technique for quantifying elemental composition as a function of sputtering depth.
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Glow Discharge Optical Emission Spectroscopy (GDOES)
In Analytical Chemistry
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition of solids. It is particularly well suited for analysis on thin- and thick-film samples, or for depth-profiling of multilayer film stacks.
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Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
In Analytical Services,Analytical Chemistry
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a destructive chemical analysis technique which measures the elemental composition of a sample. It is one of the most sensitive multiple-element analysis methods, with detection limits down to ng/L.
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Ion Scattering Spectroscopy (ISS)
In Analytical Chemistry
Ion scattering spectroscopy (ISS) provides quantitative elemental composition information from the very outermost atomic layer of a surface.
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Nanoscale Secondary Ion Mass Spectrometry (Nano SIMS)
In Analytical Chemistry
Nanoscale secondary ion mass spectrometry (Nano SIMS) is a highly sensitive chemical analysis technique used to acquire 2D and 3D maps of elemental distribution information with exceptionally high spatial and mass resolutions. It is typically used to produce images of elemental concentration. Covalent partners with Toray Research Center to offer Nano SIMS on one of only about 50 total instruments for this technique available around the world.
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Nuclear Magnetic Resonance (NMR)
In Analytical Chemistry
Nuclear magnetic resonance spectroscopy (NMR) is a chemical analytical technique used to assay the composition and chemical structure of solutions, solids, mixtures, and macromolecules. Due to its ability to capture dynamic molecular behavior, it can also be used to characterize reaction kinetics, real-time structural rearrangements, substrate binding and catalysis, and many other processes.
Techniques Showcase
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
Base Price: $450 per Hour
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Base Price: $500 per Sample
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
Scanning Acoustic Microscopy (SAM)
In Microscopy & Imaging,Failure Analysis
Base Price: $450 per Sample
Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the...
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $450 per Hour
STEM is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. In Covalent's...
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $450 per Sample
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial...
Glow Discharge Optical Emission Spectroscopy (GDOES)
In Analytical Chemistry
Base Price: $375 per Hour
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
In Analytical Services,Analytical Chemistry
please contact us for pricing
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...
Capillary Flow Porometry (Porometry)
In Material Testing
please contact us for pricing
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution.
Porosimetry
In Material Testing
Base Price: $150 per Sample
Gas Adsorption Analysis is used for measuring specific surface area, pore sizes / size distribution, and overall porosity...
Tap Density Analysis
In Material Testing
Base Price: $175 per Sample
Tap Density Analysis provides fast, effective measurements of the bulk density of powders and establishes a quantitative metric...
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
Base Price: $450 per Hour
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
X-ray Computed Tomography (Micro-CT)
In Microscopy & Imaging,X-ray Analysis,Failure Analysis
Base Price: $400 per Hour
X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Base Price: $500 per Sample
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
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