Stereoscopic Scanning Electron Microscopy (SSEM): A Breakthrough Alternative for High-Res Surface Profilometry
Join this informative one-hour webinar for an in-depth look at essential techniques for measuring thin film thickness. The session will cover methods such as cross-section analysis, ellipsometry, X-ray reflectometry, fluorescence (XRR/XRF), and atomic force microscopy. Using real-world examples, it will explore the challenges and key factors in selecting the most suitable metrology approach for various materials and applications. Whether you’re involved in material development, device fabrication, or quality control, this webinar will provide valuable guidance on choosing the right measurement techniques. Additionally, it will offer insights into the advanced analytical methods used in commercial laboratories.
What You’ll Learn
- Key Measurement Techniques – Gain insights into essential methods for measuring thin film thickness, including cross-section analysis, ellipsometry, X-ray reflectometry and fluorescence (XRR/XRF), and atomic force microscopy.
- Real-World Applications – Explore case studies demonstrating how different techniques are applied and the challenges in selecting the most suitable method.
- Commercial Lab Insights – Learn about advanced analytical tools available in commercial laboratories to address thin film measurement challenges.
- Live Q&A Session – Engage with experts and get your questions answered in real time.
Register Now!
About the Speakers
Lyle Gordon
Director of Materials, Chemistry and Surfaces Group, Covalent Metrology
Dr. Gordon joined Covalent in 2023 where he manages the Materials, Chemistry and Surfaces group, overseeing X-ray metrology, analytical chemistry, and surface science. He has extensive expertise in time-of-flight mass spectrometry, particularly related to his work on atom probe tomography. Dr. Gordon completed his Bachelor of Applied Science at the University of Toronto, his PhD in Materials Science at Northwestern University, and was a postdoctoral fellow for the Department of Energy at Pacific Northwest National Lab.
Max Junda
Senior Member of Technical Staff, Covalent Metrology
Max joined Covalent in 2019 to grow and develop the company’s ellipsometry offerings. Since then, he has helped provide measurement, modeling, and consulting services to over 110 separate customers across many industries. Max’s particular interest is in developing customized data collection and optical modeling methods that expand the areas where ellipsometry can be used beyond typical film thickness and optical property measurement. He enjoys working directly with customers to understand their specific problems and data needs so that the experiments can be tailored to each application.