R&D Applications of Spectroscopic Ellipsometry (SE) - Webinar Banner Image - Header Image 2:1 Aspect

In this episode, Dr. Jianing Sun (from J.A. Woollam) explains the operating principles and theory of Spectroscopic Ellipsometry before demonstrating its broad applications in thin film research and development across industries including semiconductors, displays, optical devices, photovoltaics, biotechnology, chemistry, and advanced materials.

This webinar introduces an increasingly powerful and fast-growing optical technique for thin-film characterization: Spectroscopic Ellipsometry. Register now to learn how Ellipsometry unlocks critical R&D insights for real-time process control and property monitoring. 

  1. How does this technique work?
  2. What are the technique’s advantages and disadvantages?
  3. What properties can it measure or help to analyze?
  4. What are some examples of Spectroscopic Ellipsometry applications in industry R&D?
  5. What information can be gained through in-situ and dynamic Ellipsometry techniques?
  6. When is Ellipsometry particularly useful, and why? What samples and applications is it best suited for?

This webinar has been designed for researchers and engineers looking to advance their knowledge and skills in thin film analysis for product R&D. That said, anyone interested in learning more about optical characterization methods and the latest techniques in thin film analysis will benefit from joining!

Spectroscopic Ellipsometry is a nondestructive optical technique used to analyze thin films ranging from sub-nanometers up to tens of microns thick. It is sensitive to film thickness, uniformity, bandgap energy, alloy composition, anisotropy, and more. By performing these measurements dynamically and in real-time, experts can gain an even deeper understanding of processes and evolving physical and optical properties of materials. 

Its growing popularity in the semiconductor, biotech, chemistry, and electronics industries evinces its versatility and utility. 

Join this webinar to review common and advanced applications of Ellipsometry, including in-situ processes and dynamic measurements.

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You can access the on-demand recording of the webinar in our Covalent Academy Learning Center here:
https://academy.covalentmetrology.com/topics/rd-applications-of-spectroscopic-ellipsometry/


Dr. Jianing Sun Profile Photo

Jianing Sun, PhD

Applications Engineer, J.A. Woollam Co.

Dr. Jianing Sun joined the J.A. Woollam Company in 2008 and has since worked as an applications engineer for over 16 years. She has an extensive track record in developing ellipsometry techniques for thin-film research, particularly focusing on semiconductors and materials science.

Dr. Sun completed her Bachelor’s and Master’s of Science degrees in Chemical Engineering at Tsinghua University and received her PhD in Materials Science and Engineering at the University of Michigan.

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