Stereoscopic Scanning Electron Microscopy (SSEM): A Breakthrough Alternative for High-Res Surface Profilometry 

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful technique delivering unmatched surface sensitivity and elemental specificity in material characterization. Whether you’re researching organic or inorganic materials, ToF-SIMS offers insights into chemical compositions, molecular structures, and 3D depth profiling like no other method.

Join our experts as they break down the fundamentals, showcase diverse applications, and share some case study examples. You’ll leave with actionable insights and a deeper understanding of how ToF-SIMS can elevate your research and development efforts.

What You’ll Learn

  • The Basics of ToF-SIMS: Dive into its principles, instrumentation, and unique capabilities.
  • Applications Across Industries: Real-world case studies showcasing how ToF-SIMS solves challenges in various fields.
  • Best Practices: Tips for sample preparation, and data interpretation to ensure successful outcomes.
  • Future Potential: Explore where ToF-SIMS is heading and its role in advancing material science.

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About the Speakers


Tatyana Kravchuk

Member of Technical Staff, Covalent Metrology

Dr. Kravchuk has recently joined Covalent Metrology as a SIMS specialist. She has over 20 years of experience in Surface Science, with a background in both academia and industry. She also has an extensive track of record in material research and development with a particular focus on batteries and semiconductors. Dr. Kravchuk completed her Bachelor, Master and PhD degrees in Physical Chemistry at the Technion – Isreal Institute of Technolgy


Lyle Gordon

Director of Materials, Chemistry and Surfaces Group, Covalent Metrology

Dr. Gordon joined Covalent in 2023 where he manages the Materials, Chemistry and Surfaces group, overseeing X-ray metrology, analytical chemistry, and surface science. He has extensive expertise in time-of-flight mass spectrometry, particularly related to his work on atom probe tomography. Dr. Gordon completed his Bachelor of Applied Science at the University of Toronto, his PhD in Materials Science at Northwestern University, and was a postdoctoral fellow for the Department of Energy at Pacific Northwest National Lab.

Learn more about using Unlock the Power of ToF-SIMS: Technique, Examples and Insights services today!