Stereoscopic Scanning Electron Microscopy (SSEM): A Breakthrough Alternative for High-Res Surface Profilometry
Join Covalent for a special end-of-year live session where your questions take center stage.
This interactive webinar is your opportunity to explore the fascinating world of electron microscopy (EM) with Covalent’s experienced scientists who solve complex challenges every day. Whether you are a seasoned microscopist or just getting started, you will gain practical insights and fresh perspectives from real-world problem solving in the lab.
What to Expect
This session is designed around you as the customer. When you register, you will be invited to submit questions about your materials and products on topics related to EM such as sample preparation, imaging condition optimization, data analysis and interpretation, advanced analytical techniques, or choosing the right instrumentation.
During the live event, our experts will:
- Answer selected audience-submitted questions
- Share valuable advice and troubleshooting techniques
- Offer a behind-the-scenes look at how Covalent team solves problems
- Highlight cutting-edge capabilities available in our EM lab
You will also have the chance to ask additional questions live during the session.
Why Attend
- Gain direct, practical insights from Covalent’s electron microscopy specialists
- Learn how real problems are approached from theory to solution
- Get expert guidance tailored to your interests and challenges
- Take part in a collaborative, end-of-year learning event that celebrates discovery and innovation
Register Now!
About the Speakers
Yi Zhang
Director of Electron Microscopy, Covalent Metrology
Yi Zhang is an electron microscopist with over 16 years of experience applying advanced S/TEM techniques to study diverse materials. His research and industry work across the US, Europe, and Asia reflect his strong background in cross-disciplinary collaboration and analytical problem-solving. Yi earned his Ph.D. in Materials Science and Engineering from Nanjing University and completed postdoctoral research at the University of Michigan and Stockholm University. Before joining Covalent, he was a senior research scientist at the RENEW Institute, University at Buffalo.
Kevin Wu
Electron Microscopy Metrology Manager, Covalent Metrology
Kevin Wu is the Electron Microscopy Metrology Manager at Covalent Metrology, bringing over a decade of experience in materials characterization and process engineering. He specializes in SEM, FIB, EDS, and EBSD techniques and has applied his expertise across industries such as semiconductors, batteries, and advanced manufacturing. Kevin holds both a B.S. and M.S. in Materials Science and Engineering from the University of California, Berkeley.
Esaul Garza
Operations Director of Electron Microscopy, Covalent Metrology
Esaul joined Covalent Metrology in 2024 and leads process workflow development for TEM operations. He brings over 20 years of experience in materials characterization, low-yield analysis, and root-cause failure analysis across leading-edge semiconductors, hard drive, and display technologies.
Valerie Brogden
Technical Operations and Marketing, Covalent Metrology
Valerie Brogden brings nearly 15 years of expertise in advanced metrology, characterization, and failure analysis, with a focus on FIB/SEM techniques. She has managed a multi-instrument lab supporting both academic and industry research, served as a technical session chair for multiple FIB conferences, and pioneered the first fully automated TEM sample preparation through automated lift-out. Valerie has taught graduate-level courses at the University of Oregon and holds several patents and publications in FIB/SEM innovation.