Overview: Mid-Range Optical Profilometry
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Profilometry for surface characterization and dimensioning provides invaluable insight to customers across a wide range of applications. At Covalent Metrology, profilometry covers a complete range of surface features using everything from atomic force microscopy (AFM) to optical systems to mechanical stylus systems. This overview paper will discuss the technology behind three optical profilometry techniques offered by Covalent Metrology offers and the relative advantages of each of them.