Reciprocal space mapping of epitaxial nanowires

Click below to download this Application Note

3441Reciprocal space mapping of epitaxial nanowires

The growth dynamics, and the ultimate electronic band structure-hence the physical properties-of self-assembled epitaxial semiconductor nanowires and dots depends on the strain states of epitaxial thin films, which are functions of composition, morphology, and relaxation. High-resolution X-ray reciprocal space mapping (RSM) provides a nondestructive, yet quantitative, technique for the characterization of the strain, composition, and morphology of multi-dimensional nanowire or nanodot arrays. Rigaku’s new Smartlab® automated diffractometer (Figure 1) makes reciprocal space mapping at medium, high, and very high resolution much easier and faster with minimal user interference.

About Covalent Metrology
Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insights more easily and affordably to facilitate faster development and production. Covalent is dramatically changing the characterization and imaging landscape by combining transparent pricing, data platforms, and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com