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AFM Polymer Surface Characterization

Using Tosca series atomic force microscopes to characterize polymer blends in terms of high-resolution morphology and polymer distribution.

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Covalent Metrology utilizes Atomic Force Microscopy (AFM) for in-depth characterization of polymer surfaces.

The surface properties of polymeric materials are central to their behavior in formulation and manufacturing processes, as well as in their target applications.

Tosca AFM is a powerful tool for characterizing polymer surfaces at the nanoscale. It provides not only surface morphology, but also phase contrast between different components in polymer blends in highest resolution.

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About Anton Paar USA
Anton Paar USA is a subsidiary of the Graz, Austria-based Anton Paar. Anton Paar is the world’s premier manufacturer of measuring and analytical instrumentation used by laboratories and manufacturers during both research and development and quality control. Founded in 1922, Anton Paar now has subsidiaries in 31 different countries across the world.

Since the beginning of 2018, Anton Paar USA has expanded its USA operations to include four regional offices, with full sales and laboratory operations now taking place in Torrance, California, Houston, Texas, and Chicago, Illinois, while the main Anton Paar USA headquarters remains in Ashland, Virginia.

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com