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AFM Polymer Surface Characterization

Using Tosca series atomic force microscopes to characterize polymer blends in terms of high-resolution morphology and polymer distribution.

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AFM Polymer Surface Characterization

The surface properties of polymeric materials are central to their behavior in formulation and manufacturing processes, as well as in their target applications.

Tosca AFM is a powerful tool for characterizing polymer surfaces at the nanoscale. It provides not only surface morphology, but also phase contrast between different components in polymer blends in highest resolution.

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