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Atomic Force Microscopy for Advanced Optical Components

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New applications for optical components place ever-higher demands on surface roughness and finish specifications. Current-generation atomic force microscopy (AFM) techniques provide accurate 3D images with sub-angstrom accuracy in less than a minute. These advancements make AFM ideal for applications requiring more detailed information than available with optical interferometry techniques.

In this white paper, we explain the benefits of AFM for high-resolution surface characterization.


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