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Atomic Force Microscopy for Advanced Optical Components

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Advanced optical component analysis with Atomic Force Microscopy (AFM) by Covalent Metrology.

New applications for optical components place ever-higher demands on surface roughness and finish specifications. Current-generation atomic force microscopy (AFM) techniques provide accurate 3D images with sub-angstrom accuracy in less than a minute. These advancements make AFM ideal for applications requiring more detailed information than available with optical interferometry techniques.

In this white paper, we explain the benefits of AFM for high-resolution surface characterization.

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com