Key Principles of Lamella Sample Preparation for STEM

These videos are excerpted from a Covalent Academy webinar episode presented by Ryan Dudschus, a Senior Metrology Engineer in Covalent’s electron microscopy group. His webinar presentation explains the preparation techniques used to extract high-quality lamella for (scanning) transmission electron microscopy analysis.

A Variety of Key Lamella Liftout Methods

Avoiding Common Types of Lamella Defects Caused by the Focused Ion Beam

Milling Rates and Overtilt

Overview of STEM Lamella Preparation

The Impact of Lamella Thinness on Imaging

About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com