Home Resource Key Principles of Lamella Sample Preparation for Scanning Transmission Electron Microscopy (S/TEM)

Key Principles of Lamella Sample Preparation for STEM

These videos are excerpted from a Covalent Academy webinar episode presented by Ryan Dudschus, a Senior Metrology Engineer in Covalent’s electron microscopy group. His webinar presentation explains the preparation techniques used to extract high-quality lamella for (scanning) transmission electron microscopy analysis.

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