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Scanning Electron Microscope (SEM) Optimization & Analysis

Key considerations and steps to optimize your SEM images

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Optimizing and analyzing data from Scanning Electron Microscopes (SEM) (Covalent Metrology expertise).

Scanning electron microscopy (SEM) is a powerful imaging technique used in various fields with diverse applications across different disciplines and sectors. These include: batteries, semiconductors, polymers, biological samples, metals, crystals, adhesives, fossils, corrosion, fibers, composites, etc.

SEM can help improve processes and quality control in industrial settings by providing automated multi-scale measurements to ensure high-quality products. This eBook discusses key points to consider when approaching SEM experiments.

A typical SEM experiment requires several decisions, including selecting the instrument and the detector(s) and making changes to refine the measurement. This eBook will help you gain great insights into SEM and feel confident in your future SEM projects.

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com