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Atomic Force Microscopy (AFM)

Atomic Force Microscopy Main Image
2D AFM scan of the elastic modulus of a multilayer polymer film stack.
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Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.

Strengths

  • Best height resolution among surface topography techniques
  • High lateral resolution with specialized cantilever tips
  • Rapid measurement: possible to capture images within 10 min
  • Alternative force probes (including: electric, magnetic, piezoelectric, etc) accommodate advanced analytical modes

Limitations

  • Limited field of view. Maximum scan size is 100 µm x 100 µm
  • Roughness must be less than 10 microns
  • Size, shape, and cleanliness of the tip may obscure the results

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Example Outputs Instruments Used How AFM Works

Atomic Force Microscopy Services

Example Output 5226

Atomic Force Microscopy

Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.

Electrostatic Force Microscopy

Kelvin Probe Force Microscopy

Magnetic Force Microscopy

Sample Requirements

AFM Example Outputs

Example Output 1

Quantitative Nanomechanical AFM images of carbon fibers encapsulated in epoxy: top left shows map of surface height; top right shows the log of the elastic modulus, with brighter areas on the carbon fibers corresponding to greater resilience and elasticity; bottom middle captures the deformation channel of this measurement, which shows the AFM tip compressing the fiber ends on the order of 2 nm.

Example Output 2

AFM map of the Elastic Modulus (GPa) measured across different films in a multilayer plastomer material using AM-FM mode.

Example Output 3

Tapping mode topography map on the left and Kelvin Probe Force Microscopy (KPFM) scan of surface potential at right. Scans were taken on Indium-doped Tin Oxide (ITO). KPFM can measure the work function of thin film surfaces and resolve minute differences in the surface potential using a specialized measurement mode which removes topographic contributions.

Example Output 4

Topography and Electrostatic Force Microscopy (EFM) scan on titanium carbide alumina surface. Topography image on the left shows the higher TiC grains suspended in the Al2O3 matrix. On the right is an EFM phase image maps the difference in the probe tip’s electrical attraction to the TiC grains vs the alumina.

AFM Instruments Used

Bruker Nano Dimension (with Icon and FastScan Heads)

Bruker Nano Dimension (with Icon and FastScan Heads)

Whether using the Icon scanner with ultra-low noise and high accuracy, or employing the FastScan scanner for high scan rates, the Nano Dimension AFM from Bruker delivers exceptional ease of use and fast, high-resolution imaging and analysis.

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How AFM Works

An AFM cantilever with a protruding ultra-sharp tip is raster scanned over the sample, which makes either intermittent or constant contact with the surface. The tip interacts with the sample, experiencing repulsive or attractive inter-atomic forces. A laser beam is reflected off the back of the cantilever onto a detector. As the cantilever scans, the detector monitors changes in the beam deflection. The z position of the cantilever shifts up or down to maintain a constant beam deflection and determine the vertical height of the surface.

Alternative advanced imaging modes allow for visualization and measurement of other material properties, such as: adhesion, modulus, charge distribution, work function, and magnetic domains (among others).

Learn more about using Atomic Force Microscopy services today!