WORLD-CLASS CHARACTERIZATION & IMAGING SERVICES
Covalent Metrology offers a wide range of characterization, measurement, and imaging services. We have broad capabilities in cross-sectional analyses of structure/thickness as well as characterization of crystallinity, composition, surface topography, optical constants, hardness & adhesion and much more. Our list of techniques – all operated by world class engineers and scientists – is below – and even more detail is included in our price list. Contact us to see how we can help with your characterization needs.
| Techniques | 48-hour guarantee* |
|---|---|
| PCBA testing & analysis | |
| XRD/XRR | Yes |
| Spectral Ellipsometry | Yes |
| UV-VIS-NIR | Yes |
| Optical Profilometry | |
| White Light Interferometry | Yes |
| Patterned Light / Wide Area 3D Measurement | Yes |
| Laser Confocal Microscopy | Yes |
| Advanced Optical Microscopy | Yes |
| Nanomechanical Testing | Yes |
| AFM/SPM | Yes |
| SEM | Yes |
| SEM-EDS | Yes |
| FIB-SEM | |
| pFIB-SEM | |
| TEM | |
| TEM-EDS | |
| TEM-EELS | |
| X-Ray CT | |
| XPS | |
| TOF-SIMS | |
| EPMA | |
| WDXRF/EDXRF | |
| Auger | |
| TGA | |
| DSC | |
| FTIR | |
| NMR | |
| TMA | |
| DMA | |
| ICPMS/ICP-OES | |
| Pyrolysis & thermal desorption GCMS | |
| Tensile Testing | |
| Hall Voltage | |
| Particle Counting (SP1, SP3) |
*48-Hour = 2 business days. The Guarantee applies under conditions to be met for “Standard Measurement” as well as of acceptance of the order by Covalent Metrology. “Standard Measurement” designation will be made clear at quote – large sample volumes or applications that require some development may be excluded, this will be disclosed and discussed in advance. Call us for more information.
