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Advanced Optical Microscopy
Advanced Optical Microscopy (VH Microscope)
In Failure Analysis,Microscopy & Imaging
Base Price: $225 per Hour

Optical microscopy is ubiquitous in diverse fields within academic research and commercial industries. It is an affordable, rapid analytical imaging technique used to visualize samples. While optical microscopes may be common, many instruments fall far short on performance when compared with the cutting-edge digital microscope systems available at Covalent.

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Atomic Force Microscopy
Atomic Force Microscopy (AFM)
In Material Property Analysis,Microscopy & Imaging
Base Price: $225 per Image

Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.

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Attenuated Total Reflectance FTIR
Attenuated Total Reflectance FTIR (ATR-FTIR)
In Chemical Composition
Base Price: $225 per Sample

Attenuated-total-reflectance (ATR) is a sampling mode which enhances the Fourier Transformed Infrared Spectroscopy (FTIR) signal obtained from sample surfaces, increasing sensitivity and allowing efficient measurements with minimal sample preparation. Like standard FTIR measurements, ATR-FTIR is used for chemical qualification of a sample from raw optical spectra and is often used to determine organic composition.

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Auger Electron Spectroscopy (AES)
Auger Electron Spectroscopy (AES) (Auger)
In Chemical Composition,Failure Analysis,Microscopy & Imaging
Base Price: $335 per Hour

Auger electron spectroscopy (AES) is a surface-sensitive analytical technique with high lateral resolution. It is used to quantify and map the elemental composition of the outermost 2-10 nm of a material.

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Chromatic Dispersion Profilometry
Chromatic Dispersion Profilometry (CDP)
In Microscopy & Imaging
Base Price: $360 per Hour

Chromatic dispersion profilometry is a non-contact, nondestructive analytical technique used to measure surface topography. It is particularly well suited for large area characterization (e.g. full wafers) requiring high vertical accuracy.

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Differential Scanning Calorimetry
Differential Scanning Calorimetry (DSC)
In Material Property Analysis
Base Price: $300 per Sample

Differential scanning calorimetry (DSC) is a thermal analysis technique used to characterize a variety of temperature-dependent physical and chemical changes in a material.

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Dye & Pry Testing
Dye & Pry Testing
In Failure Analysis
Base Price: $450 per Sample

Dye and Pry testing is a destructive, IPC-prescribed failure-analysis and quality-control technique performed on solder joints on printed circuit board assemblies (PCBA) to identify certain defects unique to solder joints, such as: cracks, “head-in-pillow” defects, and other joint separations. Even when compared against X-ray analytical techniques, 'Dye and Pry' remains the most widely accepted technique for characterizing solder-ball die-attach quality defects. Our technical experts have over 20 years of experience executing Dye & Pry analysis in accordance with IPC standards.

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Dynamic Light Scattering
Dynamic Light Scattering (DLS)
In Particle Analysis
Base Price: $350 per Sample

Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.

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Dynamical Mechanical Analysis
Dynamical Mechanical Analysis (DMA)
In Material Property Analysis
please contact us for pricing

Dynamical mechanical analysis (DMA) is used to study changes in the mechanical properties of a material under periodic stress as the temperature is varied. DMA results are used to assess: glass transitions, melting points, elastic modulus, strain-to-break, toughness, creep, and numerous other thermal and mechanical properties.

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Electron Probe Microanalysis
Electron Probe Microanalysis (EPMA)
In Chemical Composition,Microscopy & Imaging
Base Price: $325 per Sample

Electron probe microanlysis (EPMA) is a non-destructive technique used for high-sensitivity, quantitative determination of the elemental composition of a material.

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Focused Ion Beam Scanning Electron Microscopy
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Failure Analysis,Microscopy & Imaging
Base Price: $425 per Hour

Like other high-resolution scanning electron microscopes, Focused-ion-beam scanning electron microscopes (FIB-SEMs) are used to produce 2D and 3D images of surface topography, and are able to resolve nm-scale features on a sample surface. The FIB allows advanced analytical workflows such as: cross-section, tomography, lithography, lamella prep, and many others.

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Fourier Transformed Infrared Spectroscopy
Fourier Transformed Infrared Spectroscopy (FTIR)
In Chemical Composition,Failure Analysis
Base Price: $225 per Sample

Fourier-transformed infrared spectroscopy (FTIR) is a nondestructive, optical technique used to analyze chemical composition and the optical properties of a material.

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