Attenuated Total Reflectance (ATR)
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62 techniques found
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4 Point Probe (4PP)
In Analytical Services,Material Testing
A Four Point Probe (“4PP”) is typically used to measure the sheet resistance of a conducting or semi-conducting material.
Technique Supports
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Atomic Force Microscopy (AFM)
In Material Testing,Microscopy & Imaging
Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.
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Attenuated Total Reflectance FTIR (ATR-FTIR)
In Analytical Chemistry
Attenuated-total-reflectance (ATR) is a sampling mode which enhances the Fourier Transformed Infrared Spectroscopy (FTIR) signal obtained from sample surfaces, increasing sensitivity and allowing efficient measurements with minimal sample preparation. Like standard FTIR measurements, ATR-FTIR is used for chemical qualification of a sample from raw optical spectra and is often used to determine organic composition.
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Auger Electron Spectroscopy (AES)
In Analytical Chemistry,Microscopy & Imaging,Failure Analysis
Auger electron spectroscopy (AES) is a surface-sensitive analytical technique with high lateral resolution. It is used to quantify and map the elemental composition of the outermost 2-10 nm of a material.
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Capillary Flow Porometry (Porometry)
In Material Property Testing
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution in wettable materials, such as membranes, filtration media, ceramics, and papers. Covalent’s Porometry services use a top-of-line porometer from Anton Paar for maximized flexibility, speed, and reproducibility. See Also: Gas Adsorption Analysis for non-permeable solids
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Cathodoluminescence (CL)
In Material Testing,Microscopy & Imaging
Cathodoluminescence (CL) is a combination microscopy and spectroscopy technique that produces high-speed spectral maps of optical emissions with nanoscale resolution. It is used to probe diverse features and properties of materials and devices, from the internal structures of direct bandgap semiconductors to surface plasmon resonances in metallic nanoparticles.
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Chromatic Dispersion Profilometry (CDP)
In Microscopy & Imaging
Chromatic dispersion profilometry (CDP) is a non-contact, nondestructive analytical technique used to measure surface topography. It is particularly well suited for large area characterization (e.g. full wafers) requiring high vertical accuracy.
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Differential Scanning Calorimetry (DSC)
In Material Testing
Differential scanning calorimetry (DSC) is a thermal analysis technique used to characterize a variety of temperature-dependent physical and chemical changes in a material.
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Digital Optical Microscopy (VH Microscope)
In Microscopy & Imaging,Failure Analysis
Optical microscopy is ubiquitous in diverse fields within academic research and commercial industries. It is an affordable, rapid analytical imaging technique used to visualize samples. While optical microscopes may be common, many instruments fall far short on performance when compared with the cutting-edge digital microscope systems available at Covalent.
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Dye & Pry Testing (Dye & Pry)
In Failure Analysis
Dye and Pry testing is a destructive, IPC-prescribed failure-analysis and quality-control technique performed on solder joints on printed circuit board assemblies (PCBA) to identify certain defects unique to solder joints, such as: cracks, “head-in-pillow” defects, and other joint separations. Even when compared against X-ray analytical techniques, 'Dye and Pry' remains the most widely accepted technique for characterizing solder-ball die-attach quality defects. Our technical experts have over 20 years of experience executing Dye & Pry analysis in accordance with IPC standards.
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Dynamic Light Scattering (DLS)
In Particle Analysis
Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.
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Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
In Analytical Services,Analytical Chemistry
Dynamic secondary ion mass spectroscopy (D-SIMS) is a technique used to analyze very low concentrations of elements in solid surfaces and thin films. The ability to detect up to ppb levels of trace impurities and dopants in solid materials makes D-SIMS the most sensitive surface analytical technique.
Techniques Showcase
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
Scanning Acoustic Microscopy (SAM)
In Microscopy & Imaging,Failure Analysis
Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the...
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging,Particle Analysis
STEM is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. In Covalent's...
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging,Particle Analysis
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial...
Glow Discharge Optical Emission Spectroscopy (GDOES)
In Analytical Chemistry
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
In Analytical Services,Analytical Chemistry
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...
Capillary Flow Porometry (Porometry)
In Material Testing
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution.
Porosimetry
In Material Testing
Gas Adsorption Analysis is used for measuring specific surface area, pore sizes / size distribution, and overall porosity...
Tap Density Analysis
In Material Testing
Tap Density Analysis provides fast, effective measurements of the bulk density of powders and establishes a quantitative metric...
Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
In Microscopy & Imaging
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...
X-ray Computed Tomography (Micro-CT)
In Microscopy & Imaging,X-ray Analysis,Failure Analysis
X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D...
Nanoindentation (Nano-Indent)
In Material Testing,Failure Analysis
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...
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