Filter By
× Close

Analytical Services

Explore Covalent’s portfolio of techniques by type of analysis.

What kind of analysis are you looking for?
62 techniques found
Add to comparison
4 Point Probe
4 Point Probe (4PP)
In Analytical Services,Material Testing

A Four Point Probe (“4PP”) is typically used to measure the sheet resistance of a conducting or semi-conducting material.

Technique Supports

Add to comparison
Atomic Force Microscopy
Atomic Force Microscopy (AFM)
In Material Testing,Microscopy & Imaging

Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.

Add to comparison
Attenuated Total Reflectance FTIR
Attenuated Total Reflectance FTIR (ATR-FTIR)
In Analytical Chemistry

Attenuated-total-reflectance (ATR) is a sampling mode which enhances the Fourier Transformed Infrared Spectroscopy (FTIR) signal obtained from sample surfaces, increasing sensitivity and allowing efficient measurements with minimal sample preparation. Like standard FTIR measurements, ATR-FTIR is used for chemical qualification of a sample from raw optical spectra and is often used to determine organic composition.

Add to comparison
Auger Electron Spectroscopy
Auger Electron Spectroscopy (AES)
In Analytical Chemistry,Microscopy & Imaging,Failure Analysis

Auger electron spectroscopy (AES) is a surface-sensitive analytical technique with high lateral resolution. It is used to quantify and map the elemental composition of the outermost 2-10 nm of a material.

Add to comparison
Capillary Flow Porometry
Capillary Flow Porometry (Porometry)
In Material Property Testing

Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution in wettable materials, such as membranes, filtration media, ceramics, and papers. Covalent’s Porometry services use a top-of-line porometer from Anton Paar for maximized flexibility, speed, and reproducibility. See Also: Gas Adsorption Analysis for non-permeable solids

Add to comparison
Cathodoluminescence (CL)
In Material Testing,Microscopy & Imaging

Cathodoluminescence (CL) is a combination microscopy and spectroscopy technique that produces high-speed spectral maps of optical emissions with nanoscale resolution. It is used to probe diverse features and properties of materials and devices, from the internal structures of direct bandgap semiconductors to surface plasmon resonances in metallic nanoparticles.

Add to comparison
Chromatic Dispersion Profilometry
Chromatic Dispersion Profilometry (CDP)
In Microscopy & Imaging

Chromatic dispersion profilometry (CDP) is a non-contact, nondestructive analytical technique used to measure surface topography. It is particularly well suited for large area characterization (e.g. full wafers) requiring high vertical accuracy.

Add to comparison
Differential Scanning Calorimetry
Differential Scanning Calorimetry (DSC)
In Material Testing

Differential scanning calorimetry (DSC) is a thermal analysis technique used to characterize a variety of temperature-dependent physical and chemical changes in a material.

Add to comparison
Digital Optical Microscopy
Digital Optical Microscopy (VH Microscope)
In Microscopy & Imaging,Failure Analysis

Optical microscopy is ubiquitous in diverse fields within academic research and commercial industries. It is an affordable, rapid analytical imaging technique used to visualize samples. While optical microscopes may be common, many instruments fall far short on performance when compared with the cutting-edge digital microscope systems available at Covalent.

Add to comparison
Dye & Pry Testing
Dye & Pry Testing (Dye & Pry)
In Failure Analysis

Dye and Pry testing is a destructive, IPC-prescribed failure-analysis and quality-control technique performed on solder joints on printed circuit board assemblies (PCBA) to identify certain defects unique to solder joints, such as: cracks, “head-in-pillow” defects, and other joint separations. Even when compared against X-ray analytical techniques, 'Dye and Pry' remains the most widely accepted technique for characterizing solder-ball die-attach quality defects. Our technical experts have over 20 years of experience executing Dye & Pry analysis in accordance with IPC standards.

Add to comparison
Dynamic Light Scattering
Dynamic Light Scattering (DLS)
In Particle Analysis

Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.

Add to comparison
Dynamic Secondary Ion Mass Spectrometry
Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
In Analytical Services,Analytical Chemistry

Dynamic secondary ion mass spectroscopy (D-SIMS) is a technique used to analyze very low concentrations of elements in solid surfaces and thin films. The ability to detect up to ppb levels of trace impurities and dopants in solid materials makes D-SIMS the most sensitive surface analytical technique.

Techniques Showcase

Comparison link sent successfully
Please use valid email address
You need to have at least 2 techniques to compare
You can select maximum 5 techniques
Covalent uses cookies to improve your browsing experience and to help you access the most relevant information and services efficiently. To learn more, view our
I Accept Cookies
techniques selected
Select at least 2 techniques to compare Compare techniques