
Attenuated Total Reflectance (ATR)
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Explore Covalent’s portfolio of techniques by type of analysis.

4 Point Probe (4PP)
A Four Point Probe (“4PP”) is typically used to measure the sheet resistance of a conducting or semi-conducting material.

Atomic Force Microscopy (AFM)
Atomic Force Microscopy (AFM) measures surface topography of materials with sub-nm vertical resolution. The technique delivers fast data, with simple scans requiring only a few minutes to complete.

Attenuated Total Reflectance FTIR (ATR-FTIR)
Attenuated-total-reflectance (ATR) is a sampling mode which enhances the Fourier Transformed Infrared Spectroscopy (FTIR) signal obtained from sample surfaces, increasing sensitivity and allowing efficient measurements with minimal sample preparation. Like standard FTIR measurements, ATR-FTIR is used for chemical qualification of a sample from raw optical spectra and is often used to determine organic composition.

Auger Electron Spectroscopy (AES)
Auger electron spectroscopy (AES) is a surface-sensitive analytical technique with high lateral resolution. It is used to quantify and map the elemental composition of the outermost 2-10 nm of a material.

Capillary Flow Porometry (Porometry)
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution in wettable materials, such as membranes, filtration media, ceramics, and papers. Covalent’s Porometry services use a top-of-line porometer from Anton Paar for maximized flexibility, speed, and reproducibility. See Also: Gas Adsorption Analysis for non-permeable solids

Cathodoluminescence (CL)
Cathodoluminescence (CL) is a combination microscopy and spectroscopy technique that produces high-speed spectral maps of optical emissions with nanoscale resolution. It is used to probe diverse features and properties of materials and devices, from the internal structures of direct bandgap semiconductors to surface plasmon resonances in metallic nanoparticles.

Chromatic Dispersion Profilometry (CWL)
Chromatic dispersion profilometry or Chromatic white light (CWL) profilometry is a non-contact, nondestructive analytical technique used to measure surface topography. It is particularly well suited for large-area characterization (e.g. whole wafers) requiring high vertical accuracy.

Differential Scanning Calorimetry (DSC)
Differential scanning calorimetry (DSC) is a thermal analysis technique used to characterize a variety of temperature-dependent physical and chemical changes in a material.

Digital Optical Microscopy (VH Microscope)
Optical microscopy is ubiquitous in diverse fields within academic research and commercial industries. It is an affordable, rapid analytical imaging technique used to visualize samples. While optical microscopes may be common, many instruments fall far short on performance when compared with the cutting-edge digital microscope systems available at Covalent.

Dye & Pry Testing (Dye & Pry)
Dye and Pry testing is a destructive, IPC-prescribed failure-analysis and quality-control technique performed on solder joints on printed circuit board assemblies (PCBA) to identify certain defects unique to solder joints, such as: cracks, “head-in-pillow” defects, and other joint separations. Even when compared against X-ray analytical techniques, 'Dye and Pry' remains the most widely accepted technique for characterizing solder-ball die-attach quality defects. Our technical experts have over 20 years of experience executing Dye & Pry analysis in accordance with IPC standards.

Dynamic Light Scattering (DLS)
Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.

Dynamic Secondary Ion Mass Spectrometry (D-SIMS)
Dynamic secondary ion mass spectroscopy (D-SIMS) is a technique used to analyze very low concentrations of elements in solid surfaces and thin films. The ability to detect up to ppb levels of trace impurities and dopants in solid materials makes D-SIMS the most sensitive surface analytical technique.
Techniques Showcase

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...

Nanoindentation (Nano-Indent)
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...

Scanning Acoustic Microscopy (SAM)
Scanning Acoustic Microscopy (SAM) is a non-destructive and non-invasive imaging technique which uses ultrasound signals to visualize the...

Scanning Transmission Electron Microscopy (STEM)
STEM is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. In Covalent's...

Transmission Electron Microscopy (TEM)
TEM is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial...

Glow Discharge Optical Emission Spectroscopy (GDOES)
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...

Inductively Coupled Plasma Mass Spectroscopy (ICP-MS)
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...

Capillary Flow Porometry (Porometry)
Capillary Flow Porometry (also called Porometry) is an optimal technique for characterizing through-pore size and size distribution.

Porosimetry
Gas Adsorption Analysis is used for measuring specific surface area, pore sizes / size distribution, and overall porosity...

Tap Density Analysis
Tap Density Analysis provides fast, effective measurements of the bulk density of powders and establishes a quantitative metric...

Focused Ion Beam Scanning Electron Microscopy (FIB-SEM)
FIB-SEM systems are used to produce 2D and 3D images of surface topography, and are able to resolve...

X-ray Computed Tomography (Micro-CT)
X-ray computed tomography (often referred to as Micro-CT due to its spatial resolution) is a non-contact, nondestructive 2D...

Nanoindentation (Nano-Indent)
Nanoindentation is a quasi-static mode of nanomechanical analysis used to measure hardness and reduced elastic modulus of solid...