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Particle Analysis

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Covalent provides direct and indirect particle size analysis, as well as particle zeta potential measurement to characterize the electrokinetic potential of colloidal dispersions.

Particles play a role in many industries: pharmaceuticals, slurries, polishes, powders, and industrial abrasives; they are even used in quantum dots and battery electrodes. In all these applications, particle analysis supplies key quantitative and qualitative information about the overall particle size distribution and even particle morphology.

7 techniques found in Particle Analysis
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Dynamic Light Scattering
Dynamic Light Scattering (DLS)
In Particle Analysis
Base Price: $350 per Sample

Dynamic light scattering (DLS) is an indirect, high-throughput method for measuring the sizes - by hydrodynamic diameter (HDD) - of particles in a solution.

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Laser Diffraction Particle Size Analysis
Laser Diffraction Particle Size Analysis (PSA)
In Particle Analysis
Base Price: $250 per Sample

Particle size analysis (PSA) is an indirect, optical technique used to measure particle size distributions - by equivalent spherical diameter (D10, D50, D90) - in liquid and solid samples.

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Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy (STEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $850 per Sample

Scanning transmission electron microscopy (STEM) is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. STEM is available on both Covalent's FIB-SEM  instruments, as well as our TEM. All Covalent's (S)TEM systems are additionally equipped with fully integrated energy-dispersive x-ray spectrometers (EDS or EDX) to allow correlative elemental composition and mapping analysis. NOTE: All S/TEM prices include the cost of sample prep.

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Surfscan® Particle Counting
Surfscan® Particle Counting (Surfscan)
In Analytical Services,Particle Analysis
please contact us for pricing

Particle counting by Surfscan® (“Surfscan”) is an optical, non-contact surface characterization technique designed to accomplish rapid detection of particles and in some cases wafer defects. It is one of the most common ways to quantify the number and size of particles dispersed across the surface of an unpatterned wafer (often called a blanket or monitor wafer).

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Thermogravimetric Analysis
Thermogravimetric Analysis (TGA)
In Material Property Analysis,Particle Analysis
Base Price: $300 per Sample

Thermogravimetric analysis (TGA) is used to characterize sample volatility, as well as thermal stability and response.

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Transmission Electron Microscopy
Transmission Electron Microscopy (TEM)
In Microscopy & Imaging,Particle Analysis
Base Price: $850 per Sample

Transmission electron microscopy (TEM) is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. "These are incredible images. Thanks for the preview. It is so satisfying to get definitive answers to our questions!" - Brad Aitchison, Sr. Process Engineer, Redlen Technologies   NOTE: All S/TEM prices include the cost of sample prep.

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Zeta Potential
Zeta Potential
In Material Property Analysis,Particle Analysis
Base Price: $300 per Sample

Zeta potential measures the strength of net charge on particle and solid surfaces. The higher the magnitude of this potential, the stronger the surface interactions (repulsion and/or attraction) will be when the sample contacts other charged materials.

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