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Covalent provides direct and indirect particle size analysis, as well as particle zeta potential measurement to characterize the electrokinetic potential of colloidal dispersions.
Particles play a role in many industries: pharmaceuticals, slurries, polishes, powders, and industrial abrasives; they are even used in quantum dots and battery electrodes. In all these applications, particle analysis supplies key quantitative and qualitative information about the overall particle size distribution and even particle morphology.
Scanning transmission electron microscopy (STEM) is a hybrid electron microscopy technique used for imaging and morphological characterization with atomic-scale resolution. STEM is available on both Covalent's FIB-SEM instruments, as well as our TEM. All Covalent's (S)TEM systems are additionally equipped with fully integrated energy-dispersive x-ray spectrometers (EDS or EDX) to allow correlative elemental composition and mapping analysis. NOTE: All S/TEM prices include the cost of sample prep.
Particle counting by Surfscan® (“Surfscan”) is an optical, non-contact surface characterization technique designed to accomplish rapid detection of particles and in some cases wafer defects. It is one of the most common ways to quantify the number and size of particles dispersed across the surface of an unpatterned wafer (often called a blanket or monitor wafer).
Transmission electron microscopy (TEM) is the highest-resolution imaging technique available today. It is used to visualize sample features with atomic-level spatial resolution limits in order to characterize morphology of complex nanostructures. "These are incredible images. Thanks for the preview. It is so satisfying to get definitive answers to our questions!" - Brad Aitchison, Sr. Process Engineer, Redlen Technologies NOTE: All S/TEM prices include the cost of sample prep.
Zeta potential measures the strength of net charge on particle and solid surfaces. The higher the magnitude of this potential, the stronger the surface interactions (repulsion and/or attraction) will be when the sample contacts other charged materials.
Glow discharge optical emission spectroscopy (GDOES) is a quantitative, chemical analytical technique used to study the elemental composition...
Inductively Coupled Plasma Mass Spectroscopy (ICP-MS) is a highly sensitive chemical analysis technique which measures the elemental composition...