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Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)
Ultraviolet-Visible-Near Infrared spectrophotometry (UV-Vis-NIR) is a non-destructive, non-contact optical characterization technique used to measure reflectance, absorbance, and transmittance of liquids and solids. It can be used to refine advanced optical modeling, or to make efficient, direct measurements of standard optical properties.
- Rapid, straightforward data collection
- Accepts diverse sample types
- Indirect properties require Advanced Optical Modeling
UV-Vis-NIR transmission spectrum collected on Sodalime glass with overlaid CIE Y Luminance intensity.
From: Perkin Elmer
UV-Vis-NIR transmission spectrum for sodalime glass, this time over a wider analytical wavelength range with ASTM G173 standard total light intensity overlaid.
From: Perkin Elmer
Perkin Elmer Lambda 1050
- Wavelength Range: 190 nm to 3300 nm
- With 150 mm Integrating Sphere Accessory: 250 nm to 2500 nm
The optical properties, reflectance, transmittance, and absorbance, of a material are characterized with UV-Vis-NIR by analyzing the sample response as a function of wavelength.
Covalent’s UV-Vis-NIR systems are considered dual-beam spectrometers, in which collimated beams of light are directed in two paths, one as a reference, and one towards the sample.
As the wavelength of the applied beams is scanned through an entire spectral range, the reflected or transmitted light intensities are compared between the sample and the reference path. The difference between these intensities is plotted to produce the final UV-Vis-NIR spectrum, which captures the sample’s background-subtracted optical response. Using advanced optical modeling, this raw data can then be used to derive other optical constants, as well as film thicknesses.
For materials like solar cells or glass, transmittance of light (total and/or direct) through the sample can be used to assess the effectiveness of anti-reflective coatings and uniformity of system response across the visible spectrum to inform and drive R&D, engineering, and manufacturing processes.
ATR-FTIR is a sampling mode which enhances FTIR signal obtained from sample surfaces, increasing sensitivity.
Spectral ellipsometry (SE) – also called “Spectroscopic Ellipsometry” – is a non-contact, non-destructive optical characterization technique which can...