Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)

Ultraviolet Visible Near Infrared Spectrophotometry
UV-Vis-NIR transmission spectrum collected on Sodalime glass with overlaid CIE Y Luminance intensity.

Ultraviolet-Visible-Near Infrared spectrophotometry (UV-Vis-NIR) is a non-destructive, non-contact optical characterization technique used to measure reflectance, absorbance, and transmittance of liquids and solids. It can be used to refine advanced optical modeling, or to make efficient, direct measurements of standard optical properties.

  • Rapid, straightforward data collection
  • Accepts diverse sample types
Base Prices
Technique Variants
Pricing Starts At
Ultraviolet Visible Near Infrared Spectrophotometry (UV-Vis-NIR)
$200 / Sample
UV-Vis-NIR: Surface Tension Analysis
$300 / Sample i
Price includes 5 measurements
Example Outputs

UV-Vis-NIR transmission spectrum collected on Sodalime glass with overlaid CIE Y Luminance intensity.

From: Perkin Elmer

UV-Vis-NIR transmission spectrum for sodalime glass, this time over a wider analytical wavelength range with ASTM G173 standard total light intensity overlaid.

From: Perkin Elmer
Instruments Used for UV-Vis-NIR
Perkin Elmer Lambda 1050

Perkin Elmer Lambda 1050

  • Wavelength Range: 190 nm to 3300 nm
    • With 150 mm Integrating Sphere Accessory: 250 nm to 2500 nm

View Instrument Spec Sheet

Sample Requirements
  • Solids, liquids, and powders accepted
  • For film thickness measurement: 100 nm to 1 um thick
  • Sample Size Limit: varies substantially, from 4 x 4 mm up to several cm2
How UV-Vis-NIR Works

The optical properties, reflectance, transmittance, and absorbance, of a material are characterized with UV-Vis-NIR by analyzing the sample response as a function of wavelength.

Covalent’s UV-Vis-NIR systems are considered dual-beam spectrometers, in which collimated beams of light are directed in two paths, one as a reference, and one towards the sample.

As the wavelength of the applied beams is scanned through an entire spectral range, the reflected or transmitted light intensities are compared between the sample and the reference path. The difference between these intensities is plotted to produce the final UV-Vis-NIR spectrum, which captures the sample’s background-subtracted optical response. Using advanced optical modeling, this raw data can then be used to derive other optical constants, as well as film thicknesses.

For materials like solar cells or glass, transmittance of light (total and/or direct) through the sample can be used to assess the effectiveness of anti-reflective coatings and uniformity of system response across the visible spectrum to inform and drive R&D, engineering, and manufacturing processes.

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