Attenuated Total Reflectance (ATR)
$99 Base price View My Quote RequestX-ray Diffraction
X-ray Diffraction (XRD) is a nondestructive analytical technique which can be used to measure both physical and chemical properties of crystalline powders, thin films, epitaxial films, and bulk solid materials.
At Covalent, we use the newest in XRD technology, utilizing a high-brilliance Rotating Anode Cu source, Hypix-3000 Hybrid Pixel Array detector, and a variety of high-resolution optics.
- Nondestructive
- Sensitivity to crystallographic structure
- Quantitatively measures crystalline phase and texture orientation
- Minimal sample preparation required
Limitations
- XRD without a pair distribution function has limited capabilities when applied to amorphous materials
- Elemental composition of the samples should be known in advance
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How XRD Works
X-ray diffraction results when an monochromatic, collimated X-Ray beam strikes a crystalline sample and the lattice spacings between atomic planes produce constructive interference with the incident beam at specified angles, in accordance with Bragg’s Law.
The XRD system scans over a range of diffraction angles, yielding diffraction peaks that can be correlated to distinct families of atomic planes in crystalline specimens. By analyzing the XRD peak pattern, one can: identify and quantify crystalline phases, calculate residual stress (macrostrain) in the material from measured lattice parameters, characterize the crystallite size and microstrain from peak broadening effects, and map the measured lattice parameters in reciprocal space to analyze pseudo-morphic growth of epitaxial films.
Additionally, advanced modeling can be performed from high-resolution XRD data to obtain layer composition and thickness information for epitaxial films, and rocking-curves procedures can be used to show the quality of the films.
Additional Resources
Application Note: Covalent Metrology X-ray Diffraction Offcut Measurement
IN Publications
April 2, 2021
Dr. Colleen Frazer summarizes the impact of offcut angle on thin film growth, and detaills the industry-standard process by which offcut angle is analyzed using X-ray Diffraction (XRD).
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