UV-Vis-NIR Spectroscopy

UV-Vis-NIR Spectroscopy

Ultraviolet-visible-near infrared spectroscopy is used for reflectance (R) and transmittance (T) measurements, across the ultra-violet, visible and near infrared spectrum. These are particularly useful to the solar, displays and optical systems and coatings development: effectiveness of anti-reflective coatings for solar cells, uniformity of system response across the visible spectrum for displays can typically be characterized by spectrophotometry.


Optics (components, coatings including anti-reflective and high-reflection coatings), displays, solar, coatings, semiconductors characterization.


  • Optical constants:
    • reflectance (R) and transmittance (T)
    • refractive index (n) and extinction coefficient (k) (accessible through modeling)
  • Film thickness 100nm-1um (~Å accuracy)

Uses & Limitations:

  • What it is great for:
    • Great complement to Spectral Ellipsometry for collecting data for refined optical modeling

Example Outputs



Shimadzu SolidSpec DUV 3700 (UV-Vis-NIR)

Perkin Elmer Lambda 1050

Jasco UV/VIS/NIR Spectrometer