Ultraviolet-visible-near infrared spectroscopy is used for reflectance (R) and transmittance (T) measurements, across the ultra-violet, visible and near infrared spectrum. These are particularly useful to the solar, displays and optical systems and coatings development: effectiveness of anti-reflective coatings for solar cells, uniformity of system response across the visible spectrum for displays can typically be characterized by spectrophotometry.
Optics (components, coatings including anti-reflective and high-reflection coatings), displays, solar, coatings, semiconductors characterization.
- Optical constants:
- reflectance (R) and transmittance (T)
- refractive index (n) and extinction coefficient (k) (accessible through modeling)
- Film thickness 100nm-1um (~Å accuracy)
Uses & Limitations:
- What it is great for:
- Great complement to Spectral Ellipsometry for collecting data for refined optical modeling