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Crystalline Characterization of ZnO Nanowire and GaN Flake using STEM-CL

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Crystalline Characterization of ZnO Nanowire and GaN Flake using STEM-CL

STEM-CL is an analytical tool which is similar to well-known techniques: SEM-CL, PL, and EELS. We developed new STEM-CL apparatus. In this work, we introduce crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.


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