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Crystalline Characterization of ZnO Nanowire and GaN Flake using STEM-CL

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Crystalline characterization of ZnO nanowire and GaN flake using STEM-CL by Covalent Metrology, facilitating research on next-generation electronics.

STEM-CL is an analytical tool which is similar to well-known techniques: SEM-CL, PL, and EELS. We developed new STEM-CL apparatus. In this work, we introduce crystalline quality to GaN flakes and ZnO nanowires by STEM-CL.

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Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

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