Full Atomic Force Microscopy Investigation of a Polymer Thin Film with Tosca series AFMs

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Excerpted from the Text:
In addition to easy and safe handling (the actuator body fits onto the palm of your hand), one of the most prominent advantages of the Tosca AFM’s patented design is the possibility to perform all measurements for all modes with one and the same actuator body. This opens up the flexibility to measure various properties of the sample without any hardware handling – with one and the same cantilever (if applicable): Contact, Tapping, Force distance curve, Contact resonance amplitude imaging (CRAI), Electrostatic force microscopy (EFM), Magnetic force microscopy (MFM), Kelvin probe force microscopy (KPFM), Conductive AFM (C-AFM, 3 gains) – on the same location with one actuator body.

To demonstrate this capability, an AFM investigation of a PMMA/SBS polymer blend was performed on a 25 x 25 μm area with a resolution of 400 x 400 pixels and a scan rate of 0.5 line/seconds. Force distance curve, contact resonance amplitude imaging (CRAI). Electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM)2 were employed at the same position with a single hardware set-up and
the same cantilever – without any hardware changes in between the measurements.