Become an Ionic Member
Contact Us
Schedule Pickup
Analytical Services
Analytical Chemistry Services
Electron Microscopy Services
Material Property Testing
Optical Analysis Services
Optical Microscopy and Profilometry
Particle and Particle Size Analysis
Scanning Probe Techniques
X-ray Analysis Techniques
Business Services
Ionic Membership Program
Upgrade your metrology strategy with high-touch, expert support and Covalent’s full portfolio of analytical solutions.
Advanced Modeling and Data Analysis
Advanced modeling and data analysis allow you to maximize the utility and insight from your metrology results. Covalent can help.
Covalent Live-View
Consulting Services
Covalent’s consulting services provide a cost-effective way to flex your team’s capacity and accelerate resolution of your R&D challenges.
Failure Analysis
Method Development
If you have been struggling to find the right metrology method or recipe, our experts can help you design and optimize strategic experiments.
Resources
Covalent Academy
Blog
Newsroom
Resource Library
About Us
About Covalent
Covalent Careers
Covalent Partners
Login
Get A Quote
Items in Quote List
Get a Quote
Browse Services
Home
/
KPFM
KPFM
Application Note
,
Resource
Full Atomic Force Microscopy Investigation of a Polymer Thin Film with Tosca series AFMs
January 4, 2021
