Transmission Electron Microscopy (TEM) and Scanning Transmission Electron Microscopy (STEM) enable engineers to visualize and analyze nano-scale materials, particles, and assemblies with imaging resolution at an atomic scale. S/TEM techniques allow us to collect both spatial and chemical information from the tiniest structures and interfaces for semiconductors, electronics, and advanced devices. Analysis at the atomic level provides insights that propel innovation forward and speeds development of critical new technology.
It begs the question: why aren’t more people using TEM in their research and development work?
The answer for many boils down to some common myths about modern-day TEM. Throughout much of its history, S/TEM analysis was thought to be possible only at the cutting-edge research universities or corporate analytical labs with million-dollar budgets. S/TEM was envisioned to be prohibitively expensive, both in terms of money and time, and it’s easy to assume that these drawbacks would persist today.
You might be surprised to learn that TEM analysis – from sample prep through to data interpretation – can now take only a few hours!
What’s more, it is no longer necessary for research teams to purchase and maintain their own instrument in-house to access the insights from S/TEM analysis. Between leaps forward in instrumentation and automation, and the increased availability of S/TEM analysis, the technique has never been so approachable and affordable.
The S/TEM Analysis team at Covalent Metrology has put together this eBrief to resolve 7 of the most common misunderstandings about modern TEM capabilities and applications and help you avoid dismissing S/TEM characterization that could unlock powerful insights for your project.
Are any of these myths holding you back?
To learn more and request a quote for S/TEM services, explore:
And stay tuned! Coming up in July, I will be speaking at another Covalent Academy webinar event that explores the impact and best practices for sample preparation techniques used in S/TEM analysis.