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CT vs SEM: Which is Better?

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Covalent Metrology explores the advantages and limitations of X-ray Computed Tomography (CT) and Scanning Electron Microscopy (SEM) for battery research, aiding researchers in choosing the optimal technique for subsurface imaging.

If you need to analyze subsurface features in your advanced materials or devices, should you use Micro-Computed X-ray Tomography (Micro-CT) or Scanning Electron Microscopy (SEM)?

The answer depends on the sample and your research aim.

In this eBook, X-ray CT expert Aya Takase from Rigaku has invited an SEM expert, Avery Green from Covalent Metrology, to discuss the different uses of both techniques. Aya and Avery answer commonly asked questions about X-ray CT and SEM and choose a “winner†for each case.

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About Covalent Metrology

Covalent Metrology is a disruptive analytical services laboratory and platform based in Sunnyvale, California. Its mission is to help companies using advanced materials and nanoscale devices accelerate product development with deeper insights and better analytical data. Covalent offers comprehensive solutions and services that integrate state-of-the-art lab infrastructure, world-class experts in a wide array of analytical techniques, and modern data management and analysis.

Covalent now has over 500 customers in 30+ industries.

Learn more at: https://covalentmetrology.com