Covalent Metrology Installs Advanced Surface Analysis Instrument from Thermo Scientific

Nexsa XPS Covalent Metrology

Nexsa XPS includes UPS and ISS modules; offers precise chemical mapping and the latest automation software

 

June 4, 2020 – Sunnyvale, CA. Covalent Metrology is pleased to announce the installation of a new Thermo Scientific Nexsa X-Ray Photoelectron Spectroscopy (XPS) System at our Sunnyvale, CA headquarters. This system, available now, expands the Covalent service offerings to include two new surface characterization techniques: ultraviolet photoelectron spectroscopy (UPS) and ion-scattering spectroscopy (ISS), and allows more precise, advanced analyses with XPS.

Nexsa XPS Covalent Metrology

Chris Moore, VP of Technology at Covalent, comments: Our new, state-of-the-art Thermo Scientific Nexsa gives us access to capabilities that are unique in our industry. The combination of XPS, UPS and ISS technologies, an upgraded charge mitigation system, along with faster measurement and analysis software allow us to solve customer problems that would not have been doable with older generation systems.” Covalent will be one of only a handful of service labs worldwide to operate a Nexsa system.

 

Surface chemical analysis is critical both in product development and manufacturing optimization for industries ranging from microelectronics to pharmaceuticals. XPS has long been one of the best techniques for such analysis. It is quantitative, acutely surface specific, and can assess oxidation states, chemical bonding environments, electronic properties, and more. UPS and ISS are newer techniques which provide complementary measurements of surface potential and valence band properties, as well as chemical composition of the outermost atomic monolayer (respectively). All 3 can now be executed in correlative analysis to more holistically evaluate the surface properties of your material.

 

Beyond its adaptability and cutting-edge integration of the 3 techniques, the Nexsa also resolves several limitations of past XPS instrumentation. Most significantly, its newly designed source, detector, and automation systems enable total-area maps in minutes with a lateral resolution down to 10 µm, without sacrificing meaningful chemical sensitivity.

 

Interested in learning more about surface spectroscopy, or the Nexsa system?

Join us next week on Covalent Academy! Dr. Roland Barbosa, the Director of Surface Characterization at Covalent Metrology, will be instructing a talk exploring key ideas and practical applications of XPS, UPS, and ISS. Click below to learn more about the upcoming webinar event:

 

 

About Covalent Metrology

Covalent Metrology is a disruptive analytical services lab and platform based in Sunnyvale, California. Its mission is to help companies who use advanced materials to get better data and insight about key research, development and production programs faster, more easily and less expensively. Covalent is dramatically changing the characterization and imaging landscape by combining innovative pricing, data platforms and top-notch customer service with world-class scientists, state-of-art tools, and strategic partnerships. Covalent has nearly 300 customers in 20+ industries.

For further information, contact:

Warren Wong
Covalent Metrology Marketing
+1 408-498-4611
warren@covalentmetrology.com